Conclusions
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1.
The size of the crystallites in a “thin” film depends on its thickness in contrast to a “thick” film. “Thin” copper, aluminum, and nickel films of a nanosize thickness differ substantially from massive films in their electrical resistivity. The electrical resistivity of “thin” films is determined by their thickness and can exceed the electrical resistivity of the metals themselves by an order of magnitude or more when the thickness decreases.
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2.
In some cases “thin” films behave like dielectrics. Just like dielectrics, they are optically transparent and break under the action of electric current by the mechanism of surface and thermal breakdowns.
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3.
The voltage of the surface breakdown and the fracture behavior of “thin” metallic films depend on the electrical resistivity of the material and the size of the crystallites in the surface layer of the film. The smaller the crystallites and the higher the electrical resistivity the higher the breakdown voltage.
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Translated from Metallovedenie i Termicheskaya Obrabotka Metallov, No. 6, pp. 45–47, June, 2000.
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Bykov, Y.A., Karpukhin, S.D. & Gazukina, E.I. On some special features of the structure and properties of metallic “thin” films. Met Sci Heat Treat 42, 250–252 (2000). https://doi.org/10.1007/BF02471322
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DOI: https://doi.org/10.1007/BF02471322