Abstract
Spectra of foil-excited ions at tandem energies in the EUV region show many unclassified lines. In order to provide a basis for term analysis, high resolution spectra of Si are taken using a ruled 600 l/mm grating in 3rd diffraction order and two holographic gratings of 1,200 l/mm resp. 3,600 l/mm in first diffraction order. With the latter grating the resolution power of a 2.2 m grazing-incidence monochromator is sufficient to measure fine-structure splittings of inter-shell transitions of O VI–O VIII and Si X–Si XII in the wavelength rangeλ < 20 nm. The performance of the gratings is demonstrated.
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Träbert, E., Heckmann, P.H., v. Buttlar, H., Brand, K.: Z. Physik A279, 127 (1976)
Griffin, P.M., Pegg, D.J., Sellin, I.A., Jones, K.W., Pisano, D.J., Kruse, T.H., Bashkin, S.: In Sellin/Pegg (eds.), Beam-foil Spectroscopy, Vol. I. New York: Plenum 1976
Nitsche, W., Träbert, E., Heckmann, P.H.: Proceedings of the 5th Int. Conf. BFS, Lyon 1978 (to be published in J. de Physique)
Kelly, R.L., Palumbo, L.J.: Atomic and Ionic Emission Lines below 2,000 Ångstroms, Hydrogen through Krypton, NRL, Washington, 1973
Fawcett, B.C.: J. Phys. B4, 1115 (1971)
Tondello, G.: J. Phys. B2, 727 (1969)
Nikolaev, V.S., Dmitriev, I.S.: Phys. Lett.28A, 277 (1968)
Delaunay, B.: Nucl. Instrum. Meth.146, 101 (1977)
O'Brien, R., Silver, J.D., Jelley, N.A., Bashkin, S., Träbert, E., Heckmann, P.H.: J. Phys.B (to be published)
Bashkin, S., Stoner, J.O.: Atomic Energy Levels and Grotrian Diagrams, I., Hydrogen I through Phosphorus XV. Amsterdam, Oxford, New York: North Holland/American Elsevier 1975
Vainstein, L.A., Safronova, U.I.: Inst. Lebedev, Moskow, preprint No. 6 (1975)
Ermolaev, A.M., Jones, M.: J. Phys. B7, 199 (1974)
Ermolaev, A.M.: private communication (1977)
Mohr, P.J.: private communication (1978)
Ericson, G.W.: J. Chem. Phys. Ref. Data6, 831 (1977)
Bergqvist, K.-E.: Beam-foil Spectroscopy, Sellin/Pegg (eds.), Vol. II. New York: Plenum 1976
Stoner, J.O., Leavitt, J.A.: Appl. Phys. Lett.18, 477 (1971)
Jelley, N.A., Silver, J.D., Armour, I.A.: J. Phys. B10, 2339 (1977)
Feldman, U., Cohen, L., Behring, W.: J. Opt. Soc. Am.60, 891 (1970)
Hoory, S., Feldman, U., Goldsmith, S., Behring, W., Cohen, L.: J. Opt. Soc. Am.60, 1449 (1970)
Hoory, S., Goldsmith, S., Feldman, U., Behring, W., Cohen, L.: J. Opt. Soc. Am.61, 504 (1971)
Fawcett, B.C.: Atomic Data and Nucl. Data Tables16, 135 (1975)
Bates, D.R., Damgaard, A.: Phil. Trans. R. Soc. London A242, 101 (1949)
Träbert, E., Heckmann, P.H., v. Buttlar, H.: Z. Physik A281, 333 (1977)
Träbert, E., Winter, H., Heckmann, P.H., v. Buttlar, H.: Nucl. Instrum. Meth.135, 353 (1976)
Speer, R.J.: Space Sci. Instr.2, 463 (1976)
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We thank the accelerator staff for technical help in providing the Si-beam and U. Beyer for his craftsmanship in constructing the chamber. The grant of the monochromator and the gratings by the Deutsche Forschungsgemeinschaft is gratefully acknowledged.
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Träbert, E., Heckmann, P.H. & Buttlar, H.v. Highly resolved EUV beam-foil spectra of silicon. Z Physik A 290, 7–12 (1979). https://doi.org/10.1007/BF01408473
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DOI: https://doi.org/10.1007/BF01408473