Conclusions
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1.
Analog-to-digital conversion can be made at frequencies of several and even tens of me gahertz at errors of ≥2% of the maximum measured current of 5 mA, and at frequencies of tens and hundreds of kilohertz with an error of <2%.
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2.
The problem of contactless commutation of low-level signals is solved by using semiconductor switches with epitaxial silicon transistors made of a single piece of semiconductor material and located in a single casing. The switches can be controlled directly by the triggers.
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3.
Contactless switching by means of measuring amplifiers consisting of differential dc amplifiers with planar silicon transistors and by using ultrahigh-speed analog-to-digital converters provides information-feeding devices with a speed of operation approaching that of universal computers and ensures the interaction of these devices in a real time scale.
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Strashun, Y.P. Application of new semiconductor elements in multichannel measuring analog-to-digital converters. Meas Tech 9, 13–21 (1966). https://doi.org/10.1007/BF01000859
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DOI: https://doi.org/10.1007/BF01000859