Metrological assurance of measuring instruments for capacitive parameters of varicaps

Abstract

A set of standard measuring instruments (SMIs) has been developed for metrological assurance of newly produced fast meters for the capacitance and loss tangents tanδ of varicaps at 1 MHz. The SMIs incorporate a multivalued measuring standard for the range 1–1000 pF, a set of composite standards of tanδ in the range 2.10⁻⁵–0.05 for the same capacitance, and a digital comparator. The errors of measurement are 0.01% for capacitance and 0.002 tanδ + (2–3)·10⁵ for tanδ. The SMIs are used to verify control specimens of varicaps used for periodic checking of fast capacitance and loss tangent meters.