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Enhancing on-line testability during synthesis

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Abstract

If off-line testing is complemented by on-line checks, in general some of the test hardware is only used either for on-line checking (e.g., control flow monitors) or for production testing (e.g., pattern generators). In this article a hardware structure for controllers is presented, in which the complete test circuitry can be used for both facilitating a self-test and for checking the control flow during normal operation. The corresponding design procedure considers this target structure while synthesizing the controller from a behavioral description and thus minimizes the hardware overhead. Existing approaches for designing concurrently checked controllers can be represented as special cases in the formal framework established in this article.

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  1. FB 12-Rechnerstrukturen, Universität-GH-Siegen, Hölderlinstr, 3, 5900, Siegen, Germany

    Bernhard Eschermann

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  1. Bernhard Eschermann
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Eschermann, B. Enhancing on-line testability during synthesis. J Electron Test 4, 105–116 (1993). https://doi.org/10.1007/BF00971943

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  • DOI: https://doi.org/10.1007/BF00971943

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