Abstract
A model is proposed for the density profile in films of liquid helium adsorbed on solid substrates at temperatures below the λ-point. According to the model, the inhomogeneous part of the density profile is described by the contribution of van der Waals forces at all distances from the substrate greater than the thickness of the frozen helium layer. The connection between the mass of helium adsorbed on the surface and the average film thickness obtained on the basis of this model agrees with adsorption isotherms measured experimentally and may be used for a reliable determination of the thickness of thin films.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 9, pp. 16–20, September, 1981.
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Pikhitsa, P.V., Salistra, G.I. Theory of adsorbed thin films of helium. Soviet Physics Journal 24, 792–796 (1981). https://doi.org/10.1007/BF00891321
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DOI: https://doi.org/10.1007/BF00891321