Abstract
We report preliminary measurements of high (ripplon-limited) electron mobility on helium films supported by a hydrogen-coated glass substrate. From the smooth dependence of the mobility as a function of helium film thickness we deduce that no polaron transition occurs on films thicker than 500 Å at T>1 K. On poorer quality substrates we observe a rapid drop in the mobility at a substrate-dependent critical film thickness. We interpret these drops as due to localization in variations in the substrate potential.
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References
M. Saitoh,Surf. Sci. 142, 114 (1984).
E. Y. Andrei,Phys. Rev. Lett. 52, 1449, (1984).
H. W. Jiang and A. J. Dahm,Surf. Sci. 229, 352 (1990).
H. W. Jiang, M. A. Stan and A. J. Dahm,Jap. J. App. Phys. 26, S 26-3, 745 (1987).
A. D. Migone, A. Hofmann, J. G. Dash, and O. E. Vilches,Phys. Rev. B37, 5440 (1988).
V. A. Buntar', V. N. Grigor'ev, O. I. Kirichek, Y. Z. Kovdrya, Yu. P. Monarkha, and S. S. Sokolov,J. Low Temp. Phys. 79, 323 (1990).
M. Saitoh,J. Phys. Soc. Japan,42, 201 (1977).
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Hu, X.L., Carmi, Y. & Dahm, A.J. Trapping of two-dimensional electrons in substrate potentials. J Low Temp Phys 89, 625–628 (1992). https://doi.org/10.1007/BF00694102
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DOI: https://doi.org/10.1007/BF00694102