Abstract
The dielectric constant of a PbTe epitaxial layer has been measured by surface wave spectroscopy using an optically pumped far-infrared laser and the technique of attenuated total reflection.
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Tacke, M., Schuberth, W., Becker, C.R. et al. The dielectric constant of PbTe at 4.2 K and\(\tilde v\)=84.15 cm-1, 96.97cm−1, 103.60cm−1 . Appl. Phys. A 28, 229–233 (1982). https://doi.org/10.1007/BF00618699
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DOI: https://doi.org/10.1007/BF00618699