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The estimation of the charge transfer resistance by graphical analysis of inclined semicircular complex impedance diagrams

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Abstract

Recently a graphical method for the determination of the charge transfer resistance, obtained from impedance measurements, was developed. The original method was limited to perfect, semicircular Nyquist plots. Extension to inclined or depressed semicircular arcs is made possible by a few simple mathematical and graphical manipulations.

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Authors and Affiliations

  1. Laboratorium voor Non-Ferrometallurgie, Rijksuniversiteit te Gent, B-9000, Gent, Belgium

    L. Lemaitre, M. Moors & A. P. Van Peteghem

Authors
  1. L. Lemaitre
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  2. M. Moors
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  3. A. P. Van Peteghem
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Lemaitre, L., Moors, M. & Van Peteghem, A.P. The estimation of the charge transfer resistance by graphical analysis of inclined semicircular complex impedance diagrams. J Appl Electrochem 13, 803–806 (1983). https://doi.org/10.1007/BF00615830

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  • DOI: https://doi.org/10.1007/BF00615830

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