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Estimation of thermophysical properties of a film coated on a substrate using pulsed transient analysis

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Abstract

The thermophysical properties (thermal diffusivity, effusivity) of a film coated on a substrate have been measured by a pulsed transient analysis. The experimental approach is to utilize the film surface temperature decay following a heating pulse from a Q-switched Nd:glass laser. The temperature decay was measured using a HgCdTe infrared detector. Following the collection of data, a nonlinear least-squares regression was performed to estimate the optimal values of three separate thermal parameters by fitting the data to the semiinfinite substrate model solution. The model was checked systematically by analysis of the sensitivity and correlation of the three parameters, and the thermal diffusivity and effusivity ratio of the film and substrate were obtained from the optimal values of the estimated parameters.

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Authors and Affiliations

  1. Temperature Laboratory, Korea Research Institute of Standards and Science, P.O. Box 3, 305-606, Taedok Science Town, Taejon, Republic of Korea

    S. W. Kim

  2. Thermophysical Properties Research Laboratory, School of Mechanical Engineering Purdue University, 47906, West Lafayette, Indiana, USA

    R. E. Taylor

Authors
  1. S. W. Kim
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  2. R. E. Taylor
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Kim, S.W., Taylor, R.E. Estimation of thermophysical properties of a film coated on a substrate using pulsed transient analysis. Int J Thermophys 14, 135–147 (1993). https://doi.org/10.1007/BF00522667

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  • DOI: https://doi.org/10.1007/BF00522667

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