Overview
- Serves as an expanded and thoroughly updated successor to the authors’ 1992 “Electron Microdiffraction,” the leading text in the field
- Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
- Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
- Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
- Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
- Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
- Includes supplementary material: sn.pub/extras
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Table of contents (17 chapters)
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Authors and Affiliations
About the authors
John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Bibliographic Information
Book Title: Advanced Transmission Electron Microscopy
Book Subtitle: Imaging and Diffraction in Nanoscience
Authors: Jian Min Zuo, John C.H. Spence
DOI: https://doi.org/10.1007/978-1-4939-6607-3
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media New York 2017
Hardcover ISBN: 978-1-4939-6605-9Published: 26 October 2016
Softcover ISBN: 978-1-4939-8249-3Published: 23 June 2018
eBook ISBN: 978-1-4939-6607-3Published: 26 October 2016
Edition Number: 1
Number of Pages: XXVI, 729
Number of Illustrations: 92 b/w illustrations, 218 illustrations in colour
Topics: Characterization and Evaluation of Materials, Optics, Lasers, Photonics, Optical Devices, Nanochemistry, Nanoscale Science and Technology, Nanotechnology, Solid State Physics