Abstract
Axially (c-axis)-oriented ZnO thick films with a ∼8.1 μm thickness were fabricated on ZnO seed layer coated substrates by using a filtered preheated hydrothermal solution. The thick films composed of single-crystal ZnO microrods with various diameters were formed by coalescing each nanorod together along their side surfaces. From the X-ray diffraction result a biaxial stress exists was found to exist in the as-grown thick films, and the stress gradually increased with increasing annealing temperatures from 200 to 550 °C due to a degradation in the crystalline quality. The biaxial stress is responsible for the red-shift of the optical band gap of the ZnO thick films. Photoluminescence and Hall results revealed that the optical and the electrical properties of the thick films were degenerated after high-temperature annealing (> 200 °C), which was due to the introduction of point defects, such as oxygen interstitials and zinc vacancies.
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Qiu, J., Shin, DM., He, W. et al. Synthesis and physical properties of zinc-oxide textured films by using a filtered preheated hydrothermal. Journal of the Korean Physical Society 65, 1423–1429 (2014). https://doi.org/10.3938/jkps.65.1423
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DOI: https://doi.org/10.3938/jkps.65.1423