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Analysis of Mechanical Characteristics of Surface Layers of Nickel with a Sputtered Aluminum Film after Ion-Beam Mixing

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Abstract

A study and comparative analysis of the mechanical properties of the surface layers of nickel with a sputtered aluminum film, depending on the dose of argon ion irradiation, has been performed. It is revealed that the hardness and the reduced elastic modulus at an indentation depth of 400 nm does not change and remains constant within the permissible measurement error. However, when the penetration depth of the diamond nanotip is 40 nm, the hardness, the reduced elastic modulus, and the stiffness of the samples irradiated with a dose of 1017 ions/cm2 increase significantly.

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Funding

This study was performed under State assignments of the Ministry of Science and Higher Education of the Russian Federation nos. 121030100002-0 and 0427-2019-0029. Experiments were carried out using the equipment of the “Center of Physical and Physicochemical Methods of Analysis of Properties and Characteristics of the Surface, Nanostructures, Materials and Articles” of the Udmurt Federal Research Center, Ural Branch, Russian Academy of Sciences, supported by the Ministry of Science and Higher Education under Federal Targeted Program “Investigations and development in priority trends in the development of the science and technology complex of the Russian Federation for 2014–2020” (unique identifier of the project RDMEF162119X0035).

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Authors and Affiliations

  1. Udmurt Federal Research Center, Ural Branch, Russian Academy of Sciences, 426067, Izhevsk, Russia

    A. A. Shushkov, P. V. Bykov, V. L. Vorobʼev, A. V. Vakhrushev & V. Ya. Bayankin

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  1. A. A. Shushkov
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  2. P. V. Bykov
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  3. V. L. Vorobʼev
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  4. A. V. Vakhrushev
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  5. V. Ya. Bayankin
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Correspondence to A. A. Shushkov.

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The authors declare that they have no conflicts of interests.

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Translated by N. Wadhwa

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Shushkov, A.A., Bykov, P.V., Vorobʼev, V.L. et al. Analysis of Mechanical Characteristics of Surface Layers of Nickel with a Sputtered Aluminum Film after Ion-Beam Mixing. Tech. Phys. 67, 677–682 (2022). https://doi.org/10.1134/S1063784222090079

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  • DOI: https://doi.org/10.1134/S1063784222090079

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