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Geometric Effects in Current-Voltage Characteristics of a Cross-Shaped MDM Ni/NiO/Fe Structure

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Abstract

The current–voltage (I–U) characteristics of a cross-shaped metal-dielectric-metal (MDM) Ni/NiO/Fe structures with NiO layers of different thicknesses are investigated. The dependence of the sign of the differential resistance on the current flowing through the structure and on the thickness of the NiO in a four-contact measuring system of potentials is revealed. In a region 8–10 nm thick, the voltage on the structure changes sign thrice and has the form of an N-shaped curve. This dependence is explained by the geometric effect, which appears due to the competition between the vertical and lateral electron transport, when the ratio of the resistances of the dielectric interlayer and metallic leading electrodes changes under the influence of the current. The numerical calculation confirms the experimentally observed I–U dependences.

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Authors and Affiliations

  1. Institute of Microelectronic Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, 142432, Russia

    I. V. Malikov, V. A. Berezin, L. A. Fomin & G. M. Mikhailov

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  1. I. V. Malikov
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  2. V. A. Berezin
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  3. L. A. Fomin
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  4. G. M. Mikhailov
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Correspondence to I. V. Malikov.

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Original Russian Text © I.V. Malikov, V.A. Berezin, L.A. Fomin, G.M. Mikhailov, 2018, published in Mikroelektronika, 2018, Vol. 47, No. 3.

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Malikov, I.V., Berezin, V.A., Fomin, L.A. et al. Geometric Effects in Current-Voltage Characteristics of a Cross-Shaped MDM Ni/NiO/Fe Structure. Russ Microelectron 47, 181–186 (2018). https://doi.org/10.1134/S1063739718030095

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  • DOI: https://doi.org/10.1134/S1063739718030095

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