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Low-Frequency Raman Lines as an Indicator of the Presence of Lead in Oxide Materials

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Abstract

Raman spectra were obtained for single- and polycrystalline specimens of some oxide compounds used as quantum electronic materials and for native minerals containing complex anions, where the cations are alkaline-earth metals and lead. An analysis of the low-frequency regions of the Raman spectra showed that, in some cases, the pair of high-intensity lines appearing in the range below 100 cm–1 serves as an indicator of the presence of Pb2+ ions.

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ACKNOWLEDGMENTS

The authors are greatly thankful to L.I. Ivleva for providing barium tungstate single-crystal specimens.

Funding

This study was supported by the Russian Foundation for Basic Research (project No. 17-02-00518).

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Authors and Affiliations

  1. Prokhorov General Physics Institute, Russian Academy of Sciences, 119991, Moscow, Russia

    V. E. Shukshin & P. P. Fedorov

  2. Fersman Mineralogical Museum, Russian Academy of Sciences, 119991, Moscow, Russia

    M. E. Generalov

Authors
  1. V. E. Shukshin
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  2. P. P. Fedorov
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  3. M. E. Generalov
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Corresponding author

Correspondence to P. P. Fedorov.

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Translated by O. Fedorova

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Shukshin, V.E., Fedorov, P.P. & Generalov, M.E. Low-Frequency Raman Lines as an Indicator of the Presence of Lead in Oxide Materials. Russ. J. Inorg. Chem. 64, 1442–1445 (2019). https://doi.org/10.1134/S0036023619100140

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  • DOI: https://doi.org/10.1134/S0036023619100140

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