Abstract
This study involves the preparation of ruthenium oxide (RuO2) thick films by a different method than those reported in the literature and the investigation of their dielectric properties. The substrates were coated with RuO2 thick films deposited using a mixture of invertase enzyme and ruthenium ions dissolved in water. Scanning electron microscopy-energy dispersive X-ray spectroscopy was employed for surface analysis of the films. Current/potential measurements were used to examine dielectric properties and X-ray diffraction to examine structural properties. The capacitance per unit mass of RuO2 thick films produced with invertase enzyme in amorphous structure was found to be 845 F g−1. Regarding energy dispersive X-ray spectroscopy analysis, thick films were found to contain around 79.15% ruthenium, evenly distributed on the surface of the films. In addition, we performed capacitance measurements for different temperatures and got very interesting results.
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References
Hamond C R 2005 in D R Lide (ed.) CRC handbook of chemistry and physics 86th edn (Boca Raton (FL): CRC Press)
Music D, Kremer O, Pernot G and Schneider J M 2015 Appl. Phys. Lett. 106 063906
Greenwood N N and Earnshaw A 1997 Chemistry of the elements, 2nd edn. (Oxford: Butterworth-Heinemann)
Wu X, Xiong W, Chen Y, Lan D, Pu X, Zeng Y et al 2015 J. Power Sources 294 88
Liu X M and Zhang X G 2004 Electrochim Acta 49 229
Lim J Y, Rahman G, Chae S Y, Lee K Y, Kim C S and Joo O S 2014 Int. J. Energy Res. 38 875
Lee J-B, Jeong S-Y, Moon W-J, Seong T-Y and Ahna H-J 2011 J. Alloys Comp. 509 4336
Muniraj V K A, Kamaja C K and Shelke M V 2016 ACS Sustainable Chem. Eng. 4 2528
Deshmukh P R, Bulakhe R N, Pusawale S N, Sartale S D and Lokhande C D 2015 RSC Adv. 5 28687
Yong-Gang W and Xiao-Gang Z 2004 Electrochim. Acta 49 1957
Kariper İ A and Tezel F M 2018 Ceram. Int. 45 3478
Hiratani M, Matsui Y, Imagawa K and Kimura S 2000 Thin Solid Films 366 102
Reddy Y K V and Mergel D 2006 J. Mater. Sci.: Mater. Elect. 17 1029
Over H 2012 Chem. Rev. 112 3356
Aydoğan Ş, Sağlam M and Türüt A 2012 Microelectron Reliab. 52 1362
Ejderha K, Duman S, Nuhoglu C, Urhan F and Turut A 2014 J. Appl. Phys. 116 234503
Bechhoefer J, Deng Y, Zylberberg J, Lei C and Ye Z G 2007 Am. J. Phys. 75 1046
Kim H and Kim K B 2001 Electrochem. Solid-State Lett. 4 A62
Miller J M, Dunn B, Tran T D and Pekala R W 1997 J. Electrochem. Soc. 144 L309
Nam H S, Jang K S, Ko J M, Kong Y M and Kim J D 2011 Electrochim. Acta 56 6459
Zhang J, Ma J, Zhang L L, Guo P, Jiang J and Zhao X 2010 J. Phys. Chem. C 114 13608
Wu X, Zeng Y, Gao H, Su J, Liu J and Zhu Z 2013 J. Mater. Chem. A 1 469
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Kariper, İ.A., Meydaneri Tezel, F. Synthesis and characterization of RuO2 thick film supercapacitor electrode: the effect of low temperature. Bull Mater Sci 44, 284 (2021). https://doi.org/10.1007/s12034-021-02573-5
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DOI: https://doi.org/10.1007/s12034-021-02573-5