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Advances in Experimental Studies of Grain Growth in Thin Films

  • Materials Processing and Kinetic Phenomena: In Honor of Carl V. Thompson
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Abstract

In this article, we review recent developments in the experimental study of grain growth in nanocrystalline metallic thin films, emphasizing transmission electron microscopy-based imaging and orientation mapping techniques and highlighting useful experimental and data analytical frameworks for dynamic experiments. Studies of grain growth have fallen short of the scale required to fully characterize the coarsening process, and models still fail to fully capture the true behavior of grain growth in polycrystalline systems as they pertain to geometric, topological and crystallographic metrics. Moreover, existing grain growth studies are either coarse in time and temperature or otherwise limited in scope. Nevertheless, important observations such as the stagnation of thin film grain growth at a universal grain size distribution and the strong correlations between the grain boundary character distributions in thin film and bulk materials motivate larger-scale dynamic studies. Additionally, recent hardware and software advances have removed bottlenecks to large-scale and in situ data acquisition via (1) automated grain boundary segmentation in micrographs, (2) low thermal mass microelectromechanical systems and (3) integrated hardware-software drift correction and data management solutions. We argue that these innovations render thin films a key integrated experimental platform for the next generation of grain growth studies.

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Notes

  1. Due to crystal symmetries, many representations of a single misorientation relationship may be equivalent. The term “disorientation” angle is used here to refer to the representation which requires the smallest angle of rotation among a set of symmetrically equivalent misorientation relationships.

  2. This point process is non-Poissonian owing to effective interactions between the triple junctions.

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Acknowledgments

The authors gratefully acknowledge financial support from the United States National Science Foundation under grant DMS-1905492 and under the DMREF program grants DMS-2118206 and DMS-2118197. This work was carried out in part in the Electron Microscopy Laboratory of Columbia Nano Initiative (CNI) Shared Lab Facilities at Columbia University.

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  1. Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, 10027, USA

    Katayun Barmak & Matthew J. Patrick

  2. Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015, USA

    Jeffrey M. Rickman

  3. Department of Physics, Lehigh University, Bethlehem, PA, 18015, USA

    Jeffrey M. Rickman

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Barmak, K., Rickman, J.M. & Patrick, M.J. Advances in Experimental Studies of Grain Growth in Thin Films. JOM (2024). https://doi.org/10.1007/s11837-024-06475-9

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