Abstract
Sessile drop investigations were carried out on Al2O3-12.9C refractory substrates in contact with molten iron at 1823 K (1550 °C) for 30 minutes. Chemical reactions in this system resulted in the generation of trace quantities of ferro-aluminum alloys. An X-ray micro-diffraction approach was developed to localize and structurally identify these phases based on epitaxial mapping using X’Pert materials research Diffractometer. Using this technique, a small peak in the standard XRD pattern could be enhanced to four diffraction peaks with much higher intensities, leading to a much improved indexing of diffraction peaks and structural characterization of the reaction product.
Similar content being viewed by others
References
L. Zhao and V. Sahajwalla: ISIJ Int., 2003, Vol. 43, pp. 1-6.
F. McCarthy: PhD Dissertation, The University of New South Wales, Sydney, Australia, 2004.
M. Ikram-ul-haq, R. Khanna, P. Koshy, and V. Sahajwalla: ISIJ Int., 2010, Vol. 50, pp. 804-12.
R. Khanna, M. Ikram-Ul Haq, Y. Wang, S. Seetharaman and V. Sahajwalla: Metall. Mater Trans B, 2011, Vol 42B, pp. 677-684.
S.Novak, K.Vidovic, M.Sajiko and T.Kosma: J. Eur. Ceram. Soc., 1997, Vol. 17, pp. 217-223.
SOP0002: Technical document 0002, X-ray diffraction Lab. Analytical centre, University of New South Wales, 2008.
X’pert Pro MRD: 2010, http://www.panalytical.com/index.cfm?pid=321.
Rigaku: Microdiffraction, 2013, http://www.rigaku.com/applications/microdiffraction.
K.D. Bowen and B.K. Tanner: High Resolution X-ray Diffractometry and Topography, Taylor and Francis ltd, London, 1998.
S.T. Kelly, J.C. Trenkle, L.J. Koerner, S.C. Barron, N. Walker, P.O. Pouliquen, M. W. Tate, S. M. Gruner, E. M. Dufresne, T. P. Weihs and T.C. Hufnagel: J. Synchrotron Rad., 2011, Vol. 19, pp. 464-474.
T.N. Blanton: JCPDS-Intl. Cent. of Diffraction data, 2006, ISSN 1097-0002.
C. Hubbard: Private communication, Oak Ridge, TN, 1993.
K. Maca, P. Dobsak, and A.R. Boccaccini: Ceramics Int., 2001, Vol. 27, pp. 577-584.
H. Chen and C. Lin: J. Mater. Sci., 1994, Vol. 29, pp. 1352-1357.
V.A. Ustichenko and A. A. Chistyakov: Refractories, 1994, Vol. 35, pp. 81-86.
J.H. Cox and L.M. Pidgeon: Can. J. Chem., 1963, Vol. 27, pp. 671–83.
P. Lefort, D. Tetard and P. Tristant: J. Eur. Ceram. Soc., 1993, Vol. 12, pp. 123-129.
M. Heyman and C. Chatillon, J. Electrochem. Soc., 2006, Vol. 153, pp. E119-E130.
M. Halmann, A. Frei, and A. Steinfeld: Energy, 2007, Vol. 32, pp. 2420–27.
C. Chen, C. Lin, and S. Chen: Br. Ceram. Trans., 2000, Vol. 99, pp. 57–64.
K. Sasai, and Y. Mizukami: ISIJ Int., 1994, Vol. 34, pp. 802-809.
K. Sasai and Y. Mizukami: ISIJ Int., 1995, Vol. 35, pp. 26–33.
Y. Fukuda, Y. Ueshima and S. Mizoguchi: ISIJ Int., Vol. 32, 1992, pp. 164-168.
F. Hauck and J. Potschke : Arch. Eisenhuttenwes, 1982, Vol. 53, pp. 133-138.
The financial support for this research was provided by the Australian Research Council. We acknowledge technical support from Mark Wainwright Analytical Centre Electron Microscope and Solid State and Elemental Analysis Units of the University of New South Wales.
Author information
Authors and Affiliations
Corresponding author
Additional information
Manuscript submitted July 31, 2014.
Rights and permissions
About this article
Cite this article
Ikram-ul-Haq, M., Khanna, R., Wang, Y. et al. A Novel X-ray Micro-diffraction Approach for Structural Characterization of Trace Quantities of Secondary Phases in Al2O3-C/Fe System. Metall Mater Trans B 45, 1970–1973 (2014). https://doi.org/10.1007/s11663-014-0201-1
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11663-014-0201-1