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Chromosome engineering, mapping, and transferring of resistance to Fusarium head blight disease from Elymus tsukushiensis into wheat

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This manuscript describes the transfer and molecular cytogenetic characterization of a novel source of Fusarium head blight resistance in wheat.

Abstract

Fusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe [telomorph = Gibberella zeae (Schwein. Fr.) Petch] is an important disease of bread wheat, Triticum aestivum L. (2n = 6x = 42, AABBDD) worldwide. Wheat has limited resistance to FHB controlled by many loci and new sources of resistance are urgently needed. The perennial grass Elymus tsukushiensis thrives in the warm and humid regions of China and Japan and is immune to FHB. Here, we report the transfer and mapping of a major gene Fhb6 from E. tsukushiensis to wheat. Fhb6 was mapped to the subterminal region in the short arm of chromosome 1Ets#1S of E. tsukushiensis. Chromosome engineering was used to replace corresponding homoeologous region of chromosome 1AS of wheat with the Fhb6 associated chromatin derived from 1Ets#1S of E. tsukushiensis. Fhb6 appears to be new locus for wheat as previous studies have not detected any FHB resistance QTL in this chromosome region. Plant progenies homozygous for Fhb6 had a disease severity rating of 7 % compared to 35 % for the null progenies. Fhb6 has been tagged with molecular markers for marker-assisted breeding and pyramiding of resistance loci for effective control of FHB.

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Acknowledgments

We thank W. John Raupp and Robert R McIntosh for critical editorial review of the manuscript and Duane Wilson for technical assistance. This research was supported by grants from the U.S. Wheat and Barley Scab Initiative, the Kansas Wheat Commission, the Kansas Crop Improvement Association and WGRC I/UCRC NSF contract 1338897. This is contribution number 14-395-J from the Kansas Agricultural Experiment Station, Kansas State University, Manhattan, KS 66506-5502, U.S.A.

Conflict of interest

The authors declare that they have no conflict of interest.

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Authors and Affiliations

  1. Department of Plant Pathology, Wheat Genetics Resource Center, Throckmorton Plant Sciences Center, Kansas State University, Manhattan, KS, 66506-5502, USA

    Joey C. Cainong, William W. Bockus, Sunish K. Sehgal, Tatiana V. Danilova, Dal-Hoe Koo, Bernd Friebe & Bikram S. Gill

  2. South Dakota State University, Brookings, SD, 57006, USA

    Sunish K. Sehgal

  3. The National Key Laboratory of Crop Genetics and Germplasm Enhancement, Nanjing Agricultural University, 210095, Nanjing, Jiangsu, People’s Republic of China

    Yigao Feng & Peidu Chen

  4. USDA-ARS, Northern Crop Science Laboratory, Fargo, ND, 58102-2765, USA

    Lili Qi

Authors
  1. Joey C. Cainong
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  2. William W. Bockus
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  3. Yigao Feng
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  4. Peidu Chen
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  5. Lili Qi
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  6. Sunish K. Sehgal
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  7. Tatiana V. Danilova
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  8. Dal-Hoe Koo
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  9. Bernd Friebe
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  10. Bikram S. Gill
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Corresponding author

Correspondence to Bernd Friebe.

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Communicated by Pat Heslop-Harrison.

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Cainong, J.C., Bockus, W.W., Feng, Y. et al. Chromosome engineering, mapping, and transferring of resistance to Fusarium head blight disease from Elymus tsukushiensis into wheat. Theor Appl Genet 128, 1019–1027 (2015). https://doi.org/10.1007/s00122-015-2485-1

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