Abstract
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
Simancas-García, J.L.: Diagnóstico de Circuitos Integrados Analógicos y de Comunicaciones. INGE@UAN - Tendencias en la Ingeniería 1(2), 7–19 (2011)
Zorian, Y.: System-chips test strategies. In: Design Automation Conference (35th: 1998: San Francisco), San Francisco, p. 6. ACM (1998)
Hafed, M., Abaskharoun, N., Roberts, G.: A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid-State Circ. 37(4), 499–514 (2002)
Rubio, A., et al.: Diseño de circuitos y sistemas integrados, p. 446. Alfaomega, Mexico (2005)
Kundert, K., et al.: Design of mixed-signal systems-on-a-chip. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 19(12), 1561–1571 (2000)
Hafed, M., Roberts, G.: A stand-alone integrated excitation/extraction systems for analog BIST application. In: IEEE Costum Integrated Circuit Conference, p. 4. IEEE (200)
Hafed, M., Roberts, G.: Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Measur. 52(16), 1780–1786 (2003)
Hawrysh, E., Roberts, G.: An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Measur. 47(3), 748–759 (1998)
Simancas-García, J.L., Meléndez-Pertuz, F.A., González, R.E.R., Cárdenas, C.A., Collazos-Morales, C.A.: Digital analog converter for the extraction of test signals from mixed integrated circuits. In: Gervasi, Osvaldo, et al. (eds.) ICCSA 2021. LNCS, vol. 12949, pp. 207–223. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-86653-2_15
Simancas-García, J.L., Caicedo-Ortiz, J.G.: Modelo computacional de un modulador ∑-∆ de 2° orden para la generación de señales de prueba en circuitos integrados analógicos. INGE@UAN - Tendencias en la Ingeniería 5(9), 43–55 (2014)
Simancas-García, J.L.: Diseño de un Amplificador Operacional CMOS de Amplio Ancho de Banda y Alta Ganancia para Aplicaciones de Alta Velocidad. IngeCUC 9(1) (2013)
Tokheim, R.: Principios digitales, 3 edn., p. 402. MacGraw-Hill, España (1995)
Aziz, P., Sorensen, H., van der Spiegel, J.: An overview of sigma-delta converters: how a 1-bit ADC achieves more than 16-bit resolution. IEEE Signal Process. Mag. 61–84 (1996)
LNCS. http://www.numerix-dsp.com/appsnotes/APR8-sigma-delta.pdf
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2022 Springer Nature Switzerland AG
About this paper
Cite this paper
Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45
Download citation
DOI: https://doi.org/10.1007/978-3-030-98404-5_45
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-98403-8
Online ISBN: 978-3-030-98404-5
eBook Packages: Computer ScienceComputer Science (R0)