Abstract
Integrated circuit testing is continuously improved by the evolution of design, manufacturing, packaging, and new applications. Testing not only contributes to design verification, but also is an important means for defect screening. It is an important constituent throughout the life cycle of ICs. This chapter focuses on the test definition, fault model, digital signal, analog signal, mixed signal, and other different fields of testing. Meanwhile, the testing cost and data analysis involved in mass production are also explained.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
International Technology roadmap for Semiconductors. Test and Test Equipment [EB/OL]. [2017-3-1] (2015). https://www.semiconductors.org/clientuploads/Research_Technology/ITRS/2015/ITWGs/0_2015%20ITRS%202.0%20Test%20.pdf
Y. Yue, Digital Circuit and Digital Electronics (Northwestern Polytechnical University Press, Xi’an, 2004), p. 13
D.N. Liu, J. Luo, Z.W. Qiu, et al., Current situation and development trend of VLSI testing technology, in 17th National Semiconductor Integrated Circuits and Silicon Materials Conference, Sanya, (2011)
B. Hao, Fundamentals of Electronics: Digital Electronics (Xidian University Press, Xi’an, 2011)
J. Chen, Electronics (University of Electronic Science and Technology of China Press, Chengdu, 2011)
B. Feng, Research on Optimization Method of Low Power Design for Analog-Digital Mixed Signal Circuit Testing (Guilin University of Electronic Technology, Guilin, 2012)
H.M. Liu, S.S. Lin, G.J. Li, Design of dynamic parameter test platform for high speed 14-bit A/D converter. Microelectronics 1, 126–129 (2012)
R.K. Ye, Design of Analog-Digital Converter for Low and Intermediate Frequency Digital Receiver (Tianjin University, Tianjin, 2009)
T.C. Ma, S.J. Chen, RF research based on AT88RF256. Shanxi Electron. Technol. 3, 82–83 (2010)
K. Yu, The study of RFIC testing technology. China Integr. Circ. 3, 41–46 (2015)
G. Bi, Electromagnetic Field and Microwave (Zhejiang University Press, Hangzhou, 2006)
H.H. Zhang, Application of return loss measurement method in the failure process of high-frequency channel. Electric Power Inform. Commun. Technol. 10, 34–38 (2013)
G. Wei, W. JiZeng, G. Zheng, SoC Design Method and Implementation (Publishing House of Electronics Industry, Beijing, 2011)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2024 Publishing House of Electronics Industry
About this entry
Cite this entry
Zhang, Z., Qi, J., Yu, K., Wang, Q. (2024). Integrated Circuit Testing Technology. In: Wang, Y., Chi, MH., Lou, J.JC., Chen, CZ. (eds) Handbook of Integrated Circuit Industry. Springer, Singapore. https://doi.org/10.1007/978-981-99-2836-1_59
Download citation
DOI: https://doi.org/10.1007/978-981-99-2836-1_59
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-99-2835-4
Online ISBN: 978-981-99-2836-1
eBook Packages: EngineeringReference Module Computer Science and Engineering