1. Forthcoming papers

   Announcement Pages: A5 - A5

2. Editorial

   • Roland Wiesendanger

   Scanning Probe Methods in Materials Science. Part I Pages: 1 - 1

3. Dynamical friction coefficient maps using a scanning force and friction microscope

   • M. Labardi
   • M. Allegrini
   • C. Ascoli

   Scanning Probe Methods in Materials Science. Part I Pages: 3 - 10

4. Scanning and friction-force microscopy of thin C₆₀ films on GeS(001)

   • W. Allers
   • U. D. Schwarz
   • R. Wiesendanger

   Scanning Probe Methods in Materials Science. Part I Pages: 11 - 15

5. Investigation of heteroepitaxial diamond films by atomic force and scanning tunneling microscopy

   • K. Schiffmann
   • X. Jiang

   Scanning Probe Methods in Materials Science. Part I Pages: 17 - 22

6. Study of the influence of native oxide layers on atomic force microscopy imaging of semiconductor surfaces

   • H. Bluhm
   • U. D. Schwarz
   • P. Paufler

   Scanning Probe Methods in Materials Science. Part I Pages: 23 - 27

7. Ultrathin-film hardness investigations by a modified atomic force microscope

   • G. Persch
   • Ch. Born
   • B. Utesch

   Scanning Probe Methods in Materials Science. Part I Pages: 29 - 32

8. Investigation of precipitated colloidal particles by scanning force microscopy: silver-halide microcrystals

   • U. D. Schwarz
   • H. Haefke

   Scanning Probe Methods in Materials Science. Part I Pages: 33 - 40

9. Scanning probe microscopy on superconductors: Achievements and challenges

   • U. Hartmann

   Scanning Probe Methods in Materials Science. Part I Pages: 41 - 48

10. Observation of the early stages of growth and the formation of growth spirals in epitaxial YBa₂Cu₃O_7-δ thin films by AFM

    • J. Burger
    • M. Lippert
    • G. Saemann-Ischenko

    Scanning Probe Methods in Materials Science. Part I Pages: 49 - 56

11. Growth stages of YSZ-buffer layers and YBa₂Cu₃O_7−x thin films on silicon substrates studied by scanning probe microscopy

    • M. Löhndorf
    • F. Goerke
    • R. Wiesendanger

    Scanning Probe Methods in Materials Science. Part I Pages: 57 - 62

12. Recent results in magnetic force microscopy

    • A. Wadas
    • P. Rice
    • J. Moreland

    Scanning Probe Methods in Materials Science. Part I Pages: 63 - 67

13. Time-resolved emission spectroscopy of gadolinium vanadate ceramics (GdVO₄:Bi³⁺)

    • J. Leppert
    • S. Peudenier
    • G. Blasse

    Regular Papers Pages: 69 - 72

14. Pulsed 532 nm laser wirestripping: Removal of dye-doped polyurethane insulation

    • J. Brannon
    • C. Snyder

    Regular Papers Pages: 73 - 78

15. Sub-picosecond UV-laser ablation of Ni films

    • S. Preuss
    • E. Matthias
    • M. Stuke

    Rapid Communication Pages: 79 - 82

16. Measurement of the elastic properties of evaporated C₆₀ films by surface acoustic waves

    • H. Coufal
    • K. Meyer
    • P. Hess

    Rapid Communication Pages: 83 - 86