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Measurement of the elastic properties of evaporated C60 films by surface acoustic waves

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Abstract

Surface Acoustic Wave (SAW) pulses were excited in C60 films deposited on quartz and silicon substrates using pulses from excimer lasers with wavelengths of 248 nm and 308 nm for excitation. An optical beam-deflection technique and polymer electret transducers were utilized to detect the propagation of the SAW pulse with high spatial and temporal resolution, allowing an accuracy of better than 0.1% for SAW velocity measurements. With this technique the frequency dependence of the SAW velocity was determined for a number of fullerite films and density, as well as elastic bulk properties of the films were derived by a theoretical analysis of the dispersion effect.

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Authors and Affiliations

  1. IBM Research Division, Almaden Research Center, 650 Harry Road, 95120-6099, San Jose, CA, USA

    H. Coufal, K. Meyer, R. K. Grygier & M. de Vries

  2. Institute of Physical Chemistry, University of Heidelberg, Im Neuenheimer Feld 253, D-69120, Heidelberg, Germany

    D. Jenrich & P. Hess

Authors
  1. H. Coufal
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  2. K. Meyer
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  3. R. K. Grygier
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  4. M. de Vries
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  5. D. Jenrich
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  6. P. Hess
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Coufal, H., Meyer, K., Grygier, R.K. et al. Measurement of the elastic properties of evaporated C60 films by surface acoustic waves. Appl. Phys. A 59, 83–86 (1994). https://doi.org/10.1007/BF00348425

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  • DOI: https://doi.org/10.1007/BF00348425

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