1. Foreword

   • Piotr Edelman
   • Marek Skowronski

   EditorialNotes 20 April 2010 Pages: 619 - 619

2. Study of Semiconductor Multilayer Structures by Cathodoluminescence and Electron Probe Microanalysis

   • M.V. Zamoryanskaya
   • Ya.V. Kuznetsova
   • A.N. Trofimov

   OriginalPaper 20 April 2010 Pages: 620 - 624

3. Study of Metal Contamination in CMOS Image Sensors by Dark-Current and Deep-Level Transient Spectroscopies

   • F. Domengie
   • J. L. Regolini
   • D. Bauza

   OriginalPaper 20 April 2010 Pages: 625 - 629

4. Influence of Operating Conditions on Quantum Cascade Laser Temperature

   • Kamil Pierściński
   • Dorota Pierścińska
   • Maciej Bugajski

   OriginalPaper 14 April 2010 Pages: 630 - 634

5. Evolution of Optical and Mechanical Properties of Semiconductors over 40 Years

   • Sergei Pyshkin
   • John Ballato

   OriginalPaper 06 April 2010 Pages: 635 - 641

6. Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

   • Marshall Wilson
   • Piotr Edelman
   • Jacek Lagowski

   OriginalPaper 06 April 2010 Pages: 642 - 647

7. Correlation Between Oxygen Precipitation and Extended Defects in Czochralski Silicon: Investigation by Means of Scanning Infrared Microscopy

   • Yuheng Zeng
   • Xiangyang Ma
   • Deren Yang

   OriginalPaper 06 April 2010 Pages: 648 - 651

8. Defect-Related White-Light Emission from ZnO in an n-Mg_0.2Zn_0.8O/n-ZnO/SiO _x Heterostructure on n-Si

   • Peiliang Chen
   • Xiangyang Ma
   • Deren Yang

   OriginalPaper 30 March 2010 Pages: 652 - 655

9. The Use of Spatial Analysis Techniques in Defect and Nanostructure Studies

   • M.A. Moram
   • U.E. Gabbai
   • R.A. Oliver

   OriginalPaper 30 March 2010 Pages: 656 - 662

10. LBIC and Reflectance Mapping of Multicrystalline Si Solar Cells

    • B. Moralejo
    • M. A. González
    • O. Charro

    OriginalPaper 30 March 2010 Pages: 663 - 670

11. Effect on Ordering of the Growth of GaInP Layers on (111)-GaAs Faces

    • O. Martínez
    • V. Hortelano
    • T. Prutskij

    OriginalPaper 30 March 2010 Pages: 671 - 676

12. Optical and Structural Properties of In_0.08GaN/In_0.02GaN Multiple Quantum Wells Grown at Different Temperatures and with Different Indium Supplies

    • U. Zeimer
    • U. Jahn
    • M. Kneissl

    OriginalPaper Open access 26 March 2010 Pages: 677 - 683

13. Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices

    • Bin Chen
    • Jun Chen
    • Hajime Okumura

    OriginalPaper Open access 26 March 2010 Pages: 684 - 687

14. Cathodoluminescence Study of InP Photonic Structures Fabricated by Dry Etching

    • R. Chanson
    • A. Martin
    • A. Rhallabi

    OriginalPaper 26 March 2010 Pages: 688 - 693

15. Evaluation of Stress and Crystal Quality in Si During Shallow Trench Isolation by UV-Raman Spectroscopy

    • Daisuke Kosemura
    • Maki Hattori
    • Atsushi Ogura

    OriginalPaper 26 March 2010 Pages: 694 - 699

16. Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon

    • Masayuki Fukuzawa
    • Masayoshi Yamada
    • Takashi Sekiguchi

    OriginalPaper 25 March 2010 Pages: 700 - 703

17. Detailed Analysis of Temperature Characteristics of an InGaP/InGaAs/Ge Triple-Junction Solar Cell

    • Kensuke Nishioka
    • Tsuyoshi Sueto
    • Yasuyuki Ota

    OriginalPaper 25 March 2010 Pages: 704 - 708

18. Imaging Catastrophic Optical Mirror Damage in High-Power Diode Lasers

    • Mathias Ziegler
    • Jens W. Tomm
    • Thomas Elsaesser

    OriginalPaper 24 March 2010 Pages: 709 - 714

19. Threading Screw Dislocations in 4H-SiC Wafer Observed by the Weak-Beam Method in Bragg-Case X-ray Topography

    • Hirotaka Yamaguchi
    • Hirofumi Matsuhata

    OriginalPaper 24 March 2010 Pages: 715 - 718

20. Enhancement of Defect Production Rates in n-Type Silicon by Hydrogen Implantation Near 270 K

    • Yutaka Tokuda
    • Youichi Nagae
    • Jyoji Ito

    OriginalPaper 24 March 2010 Pages: 719 - 722

21. Defect Imaging in Laser Diodes by Mapping Their Near-Infrared Emission

    • Jens W. Tomm
    • Mathias Ziegler
    • Jens Biesenbach

    OriginalPaper 24 March 2010 Pages: 723 - 726

22. Structural Characterization of Doped GaSb Single Crystals by X-ray Topography

    • M. G. Hönnicke
    • I. Mazzaro
    • X. R. Huang

    OriginalPaper 23 March 2010 Pages: 727 - 731

23. Observation on Defects in Poly-Si Films Prepared by RTCVD Under Nonideal Conditions

    • Bin Ai
    • Hui Shen
    • Xue-Qin Liang

    OriginalPaper 18 March 2010 Pages: 732 - 737

24. X-ray Diffraction Imaging of Improved Bulk-Grown CdZnTe(211) and Its Comparison with Epitaxially Grown CdTe Buffer Layers on Si and Ge Substrates

    • J. K. Markunas
    • L. A. Almeida
    • J. Sanghera

    OriginalPaper 14 March 2010 Pages: 738 - 742

25. Diffraction Contrast of Threading Dislocations in GaN and 4H-SiC Epitaxial Layers Using Electron Channeling Contrast Imaging

    • M. E. Twigg
    • Y. N. Picard
    • J. A. Powell

    OriginalPaper 14 March 2010 Pages: 743 - 746

26. Photoluminescence Analysis of Iron Contamination Effect in Multicrystalline Silicon Wafers for Solar Cells

    • Michio Tajima
    • Masatoshi Ikebe
    • Atsushi Ogura

    OriginalPaper 06 March 2010 Pages: 747 - 750

27. Phonon-Assisted Tunneling from Z ₁/Z ₂ in 4H-SiC

    • A. O. Evwaraye

    OriginalPaper 06 March 2010 Pages: 751 - 755

28. Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy

    • Martina Baeumler
    • Frank Gütle
    • Thomas Rödle

    OriginalPaper 04 March 2010 Pages: 756 - 760

29. Effects of Chemical Treatment on the Luminescence of ZnO

    • B. Dierre
    • X. L. Yuan
    • T. Sekiguchi

    OriginalPaper 04 March 2010 Pages: 761 - 765

30. Classification of Energy Levels in Quantum Dot Structures by Depleted Layer Spectroscopy

    • M. Kaniewska
    • O. Engström
    • M. Kaczmarczyk

    OriginalPaper 04 March 2010 Pages: 766 - 772

31. Characterization of Generation Lifetime and Surface Generation Velocity of Semiconductor Wafers by a Contactless Zerbst Method

    • Haruhiko Yoshida
    • Shingo Kuge

    OriginalPaper 04 March 2010 Pages: 773 - 776

32. Electroluminescence Spectral Imaging of Extended Defects in 4H-SiC

    • A.J. Giles
    • J.D. Caldwell
    • K.X. Liu

    OriginalPaper 27 February 2010 Pages: 777 - 780

33. A Spectrum Image Cathodoluminescence Study of Dislocations in Si-Doped Liquid-Encapsulated Czochralski GaAs Crystals

    • M.A. González
    • O. Martínez
    • J.L. Weyher

    OriginalPaper 27 February 2010 Pages: 781 - 786

34. Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques

    • Martin C. Schubert
    • Jonas Schön
    • Wilhelm Warta

    OriginalPaper 03 March 2010 Pages: 787 - 793

35. Ion-Implantation Control of Ferromagnetism in (Ga,Mn)As Epitaxial Layers

    • O. Yastrubchak
    • J. Z. Domagala
    • T. Wosinski

    OriginalPaper 25 February 2010 Pages: 794 - 798

36. Nucleation Mechanism of 6H-SiC Polytype Inclusions Inside 15R-SiC Crystals

    • Yu Zhang
    • Hui Chen
    • Yimei Zhu

    OriginalPaper 24 February 2010 Pages: 799 - 804

37. Cathodoluminescence Study of Orientation-Patterned GaAs Crystals for Nonlinear Optics

    • O. Martínez
    • M. Avella
    • D. Bliss

    OriginalPaper 24 February 2010 Pages: 805 - 810

38. Effects of Crystal-Induced Optical Incoherence in Electro-Optic Field Sensors

    • A. Garzarella
    • S. B. Qadri
    • Dong Ho Wu

    OriginalPaper 18 February 2010 Pages: 811 - 814

39. Determination of Piezoelectric Fields Across InGaN/GaN Quantum Wells by Means of Electron Holography

    • Masashi Deguchi
    • Shigeyasu Tanaka
    • Takayoshi Tanji

    OriginalPaper 11 February 2010 Pages: 815 - 818

40. Electron Scattering Mechanism of FTO Films Grown by Spray Pyrolysis Method

    • Minoru Oshima
    • Kenji Yoshino

    OriginalPaper 04 May 2010 Pages: 819 - 822

41. Synchrotron X-Ray Topography Study of Structural Defects and Strain in Epitaxial Structures of Yb- and Tm-Doped Potassium Rare-Earth Double Tungstates and Their Influence on Laser Performance

    • B. Raghothamachar
    • J.J. Carvajal
    • M. Dudley

    OriginalPaper 28 April 2010 Pages: 823 - 829