Valence band offsets in strained GaAs1−xPx/GaAs heterojunctions Neal G. AndersonFarid AgahiKei May Lau OriginalPaper Pages: 713 - 717
Deposition and characterization of indium oxide and indium tin oxide semiconducting thin films by reactive thermal deposition technique P. ThilakanS. KalainathanP. Ramasamy OriginalPaper Pages: 719 - 724
Growth pressure effects on Si/Si1−xGex chemical vapor deposition Z. Matutinović-KrsteljE. ChasonJ. C. Sturm OriginalPaper Pages: 725 - 730
Pyrolysis of tertiarybutylphosphine at low pressure C. W. HillG. B. StringfellowL. P. Sadwick OriginalPaper Pages: 731 - 734
Defect formation in epitaxial oxide dielectric layers due to substrate surface relief P. C. McIntyreB. P. ChangM. J. Cima OriginalPaper Pages: 735 - 745
Unintentional zinc diffusion in inp pn-homojunctions C. L. ReynoldsV. SwaminathanL. C. Luther OriginalPaper Pages: 747 - 750
Improvement in dielectric properties of low temperature PECVD silicon dioxide by reaction with hydrazine K. W. VogtM. HoustonP. A. Kohl OriginalPaper Pages: 751 - 755
Epitaxial lift-off of thin InAs layers Joel FastenauEkmel özbayFran Laabs OriginalPaper Pages: 757 - 760
Atmospheric pressure chemical vapor deposition of blanket tungsten films on silicon substrates for integrated circuit applications M. S. HaqueU. V. PatelW. D. Brown OriginalPaper Pages: 761 - 766
An electrical method to characterize thermal reactions of Pd/GaAs and Ni/GaAs contacts H. F. ChuangC. P. LeeD. C. Liu OriginalPaper Pages: 767 - 772
A study of self-aligned formation of C54 Ti(Si1−xGex)2 to P+ and N+ Si0.7Ge0.3 alloys using rapid thermal annealing S. P. AshburnM. C. öztürkD. M. Maher OriginalPaper Pages: 773 - 780
Strain from modified interface compositions in InGaAs/InP superlattices A. R. ClawsonC. M. Hanson OriginalPaper Pages: 781 - 786
The growth and characterization of AlGaAs double heterostructures for the evaluation of reactor and source quality M. R. IslamR. V. ChelakaeaJ. E. Fouquet OriginalPaper Pages: 787 - 792
Characterizing electric fields in (111)B InGaAs quantum wells using electric field modulated photoluminescence and reflectance techniques Richard L. ToberThomas B. BahderJohn D. Bruno OriginalPaper Pages: 793 - 798