Abstract
Valence band offsets at [100]-oriented heterojunctions between tensile-strained GaASj1−xPx and unstrained GaAs are studied experimentally and theoretically. Light-hole (LH) and heavy-hole (HH) offsets are first extracted from the well-width dependence of valence subband splittings observed in luminescence spectra of tensile-strained GaAs1−xPx/GaAs quantum wells of various compositions (x = 0.06,0.09, and 0.19). This data is then combined with results from two other laboratories, yielding a set of 30 independent experimental offset values for junctions with compositions throughout the range 0.06≤x ≤0.32. The data are found to be highly consistent, with linear fits δELH = −140x (meV) and δEHH= −401x (meV) describing the measured offsets to within less than 5 meV on average. Experimental results are then compared with theoretical predictions for the GaAs1−x Px/GaAs system obtained from a tight-binding model for strained heterojunctions. Predictions from the tight-binding calculations are found to lie within experimental scatter for the LH offsets, which define the valence band edge in these heterostructures, while magnitudes of the tight-binding HH offsets exceed measured values by ~20% on average.
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Anderson, N.G., Agahi, F., Baliga, A. et al. Valence band offsets in strained GaAs1−xPx/GaAs heterojunctions. J. Electron. Mater. 24, 713–717 (1995). https://doi.org/10.1007/BF02659729
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DOI: https://doi.org/10.1007/BF02659729


