1. Identification of the Structure of Nanoscale Layers of Multilayer Heterocomposites using Transmission Electron Microscopy

   • R. L. Volkov
   • N. I. Borgardt

   BASIC RESEARCH 15 February 2024 Pages: 1 - 10

   

2. Characteristics and Areas of Possible Application of Amorphous Silicon–Carbon and Metal–Silicon–Carbon Films. Review

   • V. K. Dmitriev
   • E. A. Il’ichev
   • V. D. Frolov

   ELECTRONICS MATERIALS 15 February 2024 Pages: 11 - 27

   

3. Thermal Stability of Thick Films Based on Low-Temperature Thermoelectric Materials of Bi-Te-Se and Bi-Te-Sb Systems Modified with Copper-Oxide Additives

   • A. V. Babich
   • I. A. Voloshchuk
   • T. A. Babich

   ELECTRONICS MATERIALS 15 February 2024 Pages: 28 - 30

   

4. Methods for Calculating the Effective Electrophysical Properties of Inhomogeneous Media Taking into Account Various Structural Features. Review

   • I. V. Lavrov

   ELECTRONICS MATERIALS 15 February 2024 Pages: 31 - 45

5. Electrical Transport in Porous Structures of Si-Ge/c-Si Formed by the Electrochemical Deposition of Germanium in Porous Silicon

   • D. L. Goroshko
   • I. M. Gavrilin
   • V. P. Bondarenko

   ELECTRONICS MATERIALS 15 February 2024 Pages: 46 - 51

   

6. Investigation of the Dependence of the Silicon Needle Shape on the KOH Solution Concentration during Anisotropic Wet Etching

   • A. V. Novak
   • A. M. Sokolov
   • V. R. Novak

   TECHNOLOGICAL PROCESSES AND ROUTES 15 February 2024 Pages: 52 - 57

   

7. Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate

   • O. V. Podorozhniy
   • A. V. Rumyantsev
   • N. I. Borgardt

   TECHNOLOGICAL PROCESSES AND ROUTES 15 February 2024 Pages: 58 - 64

   

8. Vacuum Nanoelectronics Based on Semiconductor Field-Emission Structures: Current State and Development Prospects. Review

   • N. A. Dyuzhev
   • I. D. Evsikov

   ELEMENTS OF INTEGRATED ELECTRONICS 15 February 2024 Pages: 65 - 80

   

9. Methods of Determining the Concentration and Mobility in Layers of Space-Charge Regions

   • V. P. Karamyshev

   MICRO- AND NANOSYSTEM TECHNOLOGY 15 February 2024 Pages: 81 - 86

   

10. Investigation of the Flat Viewing Angle of Silicon Photomultipliers

    • I. R. Gulakov
    • A. O. Zenevich
    • O. V. Kochergina

    INTEGRATED RADIOELECTRONIC DEVICES 15 February 2024 Pages: 87 - 91