Investigation of the Magnesium Impurity in Silicon L. M. PortselV. B. ShumanYu. A. Astrov NONELECTRONIC PROPERTIES OF SEMICONDUCTORS (ATOMIC STRUCTURE, DIFFUSION) 28 April 2020 Pages: 393 - 398
Temperature-Dependent Total Absorption of Exciton Polaritons in Bulk Semiconductors R. P. SeisyanS. A. Vaganov ELECTRONIC PROPERTIES OF SEMICONDUCTORS 28 April 2020 Pages: 399 - 402
Dielectric Spectroscopy and Mechanism of the Semiconductor–Metal Phase Transition in Doped VO2:Ge and VO2:Mg Films A. V. IlinskiyR. A. KastroE. B. Shadrin ELECTRONIC PROPERTIES OF SEMICONDUCTORS 28 April 2020 Pages: 403 - 411
Raman Scattering in the InSb–MnSb Eutectic Composite I. Kh. MammadovD. H. AraslyA. A. Khalilova SPECTROSCOPY, INTERACTION WITH RADIATION 28 April 2020 Pages: 412 - 416
Optical Properties of GaN/SiC/por-Si/Si(111) Hybrid Heterostructures P. V. SeredinD. L. GoloshchapovS. A. Kukushkin SPECTROSCOPY, INTERACTION WITH RADIATION 28 April 2020 Pages: 417 - 425
Dependence of the Crystallization Kinetics of Cr0.26Si0.74 Thin Films on Their Thickness S. V. NovikovV. S. KuznetsovaJ. Schumann SURFACES, INTERFACES, AND THIN FILMS 28 April 2020 Pages: 426 - 428
Size Quantization in n-GaP V. R. RasulovP. Ya. RasulovR. R. Sultonov SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 28 April 2020 Pages: 429 - 432
On the Dominant Mechanism of the Nonradiative Excitation of Manganese Ions in II–VI Diluted Magnetic Semiconductors A. V. Chernenko SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 28 April 2020 Pages: 433 - 436
Modification of the Photoelectric Properties of Undoped Hydrogenated Amorphous Silicon Films under Preliminary Illumination at Elevated Temperatures N. N. OrmontI. A. Kurova AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 28 April 2020 Pages: 437 - 440
Growth and Characterization of TCNQ-Doped Ni(II)TAAB Thin Film As a New π-Conjugated Organic Semiconductor M. E. Sánchez-VergaraB. MolinaR. Salcedo AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 28 April 2020 Pages: 441 - 449
Multilevel Recording in Ge2Sb2Te5 Thin Films S. A. FefelovL. P. KazakovaA. O. Yakubov MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 28 April 2020 Pages: 450 - 453
Study of the Properties of Two-Dimensional MoS2 and WS2 Films Synthesized by Chemical-Vapor Deposition S. A. SmagulovaP. V. VinokurovI. V. Antonova MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 28 April 2020 Pages: 454 - 464
Terahertz Photoconductivity in Graphene in a Magnetic Field Yu. B. VasilievS. N. NovikovS. D. Ganichev CARBON SYSTEMS 28 April 2020 Pages: 465 - 470
Surface Modification of SOI Sensors for the Detection of RNA Biomarkers O. V. NaumovaB. I. FominD. V. Pyshnyi PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 471 - 475
Effects of Doping of Bragg Reflector Layers on the Electrical Characteristics of InGaAs/GaAs Metamorphic Photovoltaic Converters V. M. EmelyanovN. A. KalyuzhnyyM. Z. Shvarts PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 476 - 483
Light Characteristics of Narrow-Stripe High-Power Semiconductor Lasers (1060 nm) Based on Asymmetric AlGaAs/GaAs Heterostructures with a Broad Waveguide I. S. ShashkinA. Y. LeshkoP. S. Kop’ev PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 484 - 488
Single-Mode Lasers (1050 nm) of Mesa-Stripe Design Based on an AlGaAs/GaAs Heterostructure with an Ultra-Narrow Waveguide I. S. ShashkinA. Y. LeshkoP. S. Kop’ev PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 489 - 494
Investigation into the Internal Electric-Field Strength in the Active Region of InGaN/GaN-Based LED Structures with Various Numbers of Quantum Wells by Electrotransmission Spectroscopy A. E. AslanyanL. P. AvakyantsA. A. Marmalyuk PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 495 - 500
TCAD Simulation Study of Single-, Double-, and Triple-Material Gate Engineered Trigate FinFETs P. VimalaT. S. Arun Samuel PHYSICS OF SEMICONDUCTOR DEVICES 28 April 2020 Pages: 501 - 505
Features of SiO2 Layers Synthesized on Silicon by Molecular Layer Deposition A. P. BarabanE. A. DenisovR. P. Seisyan FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 28 April 2020 Pages: 506 - 510