Do Chemical Effects Affect the Accumulation of Structural Damage during the Implantation of Fluorine Ions into GaN? A. I. TitovK. V. KarabeshkinA. I. Struchkov NONELECTRONIC PROPERTIES OF SEMICONDUCTORS (ATOMIC STRUCTURE, DIFFUSION) 06 November 2019 Pages: 1415 - 1418
Temperature Coefficient of Movement of the Resonance Level of Iron in Pb1 – x – ySnxFeyTe Alloys E. P. SkipetrovB. B. KovalevV. E. Slynko ELECTRONIC PROPERTIES OF SEMICONDUCTORS 06 November 2019 Pages: 1419 - 1426
Luminescence Properties of FZ Silicon Irradiated with Swift Heavy Ions S. G. CherkovaV. A. SkuratovV. A. Volodin SPECTROSCOPY, INTERACTION WITH RADIATION 06 November 2019 Pages: 1427 - 1430
Relation between the Relaxation of Intrinsic Stimulated Picosecond Emission from GaAs with a Characteristic Charge-Carrier Cooling Time N. N. AgeevaI. L. BronevoiA. N. Krivonosov SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1431 - 1438
Quantum Corrections and Magnetotransport in 3D Dirac Semimetal Cd3 –xMnxAs2 Films A. B. MekhiyaA. A. KazakovB. A. Aronzon SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1439 - 1444
Mechanism of Singlet-Oxygen Generation on the Surface of Excited Nanoporous Silicon D. M. SamosvatO. P. Chikalova-LuzinaG. G. Zegrya SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1445 - 1456
Effect of Ion-Beam Processing during RF Magnetron Sputtering on the properties of ZnO Films P. N. KrylovA. S. AlalykinI. V. Fedotova SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1457 - 1464
Structure and Electrical Properties of (ZnO/SiO2)25 Thin Films M. N. VolochaevYu. E. KalininV. V. Bassarab SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1465 - 1471
Investigation of Composition Uniformity in Thickness of GaInAsP Layers Grown on InP Substrates by Vapor-Phase Epitaxy G. S. GagisR. V. LevinV. I. Vasil’ev SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1472 - 1478
Boson Peak Related to Ga Nanoclusters in AlGaN Layers Grown by Plasma-Assisted Molecular Beam Epitaxy at Ga-Rich Conditions V. Yu. DavydovV. N. JmerikS. V. Ivanov SURFACES, INTERFACES, AND THIN FILMS 06 November 2019 Pages: 1479 - 1488
Time-Resolved Photoluminescence of InGaAs Nanostructures Different in Quantum Dimensionality A. M. NadtochiyS. A. MintairovA. E. Zhukov SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 06 November 2019 Pages: 1489 - 1495
On the Anisotropic Trigger Electrical Properties of Two-Dimensional Superlattices D. V. Zav’yalovV. I. KonchenkovS. V. Kryuchkov SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA 06 November 2019 Pages: 1496 - 1499
Structure and Optical Properties of Chalcogenide Glassy Semiconductors of the As–Ge–Se System A. I. IsayevS. I. MekhtiyevaR. I. Alekberov AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 06 November 2019 Pages: 1500 - 1506
Structure of Se95As5 Chalcogenide Glassy Semiconductor Doped by EuF3 Impurity S. N. GaribovaA. I. IsayevS. U. Atayeva AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 06 November 2019 Pages: 1507 - 1510
Spectra of SmS Films in the Far- and Mid-Infrared Regions Yu. V. UlashkevichV. V. KaminskiN. V. Sharenkova AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 06 November 2019 Pages: 1511 - 1513
Formation of ncl-Si in the Amorphous Matrix a-SiOx:H Located near the Anode and on the Cathode, Using a Time-Modulated DC Plasma with the (SiH4–Ar–O2) Gas Phase (\({{{\text{C}}}_{{{{{\text{O}}}_{2}}}}}\) = 21.5 mol %) Yu. K. UndalovE. I. TerukovI. N. Trapeznikova AMORPHOUS, VITREOUS, AND ORGANIC SEMICONDUCTORS 06 November 2019 Pages: 1514 - 1523
Determination of the Free Charge Carrier Concentration in Boron-Doped Silicon Nanowires Using Attenuated Total Reflection Infrared Spectroscopy E. A. LipkovaA. I. EfimovaV. Yu. Timoshenko MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS 06 November 2019 Pages: 1524 - 1528
High-Voltage AlInGaN LED Chips L. K. MarkovM. V. KukushkinO. V. Osipov PHYSICS OF SEMICONDUCTOR DEVICES 06 November 2019 Pages: 1529 - 1534
Counteracting the Photovoltaic Effect in the Top Intergenerator Part of GaInP/GaAs/Ge Solar Cells M. A. MintairovV. V. EvstropovN. A. Kalyuzhnyy PHYSICS OF SEMICONDUCTOR DEVICES 06 November 2019 Pages: 1535 - 1539
On the Processes of the Self-Assembly of CdS Nanocrystal Arrays Formed by the Langmuir–Blodgett Technique K. A. SvitK. S. Zhuravlev FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 06 November 2019 Pages: 1540 - 1544
Changes in the Photoluminescence Properties of Semiconductor Heterostructures after Ion-Beam Etching Ya. V. LevitskiiM. I. MitrofanovV. P. Evtikhiev FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 06 November 2019 Pages: 1545 - 1549
On the Phase Composition, Morphology, and Optical and Electronic Characteristics of AlN Nanofilms Grown on Misoriented GaAs(100) Substrates P. V. SeredinA. V. FedyukinN. A. Pikhtin FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 06 November 2019 Pages: 1550 - 1557
Raman Scattering in AlN Crystals Grown by Sublimation on SiC and AlN Seeds I. D. BreevA. N. AnisimovE. N. Mokhov FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES 06 November 2019 Pages: 1558 - 1561