On the band spectrum in p-type HgTe/CdHgTe heterostructures and its transformation under temperature variation A. V. IkonnikovL. S. BovkunN. N. Mikhailov XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1531 - 1536
Specific features of the photoexcitation spectra of epitaxial InN layers grown by molecular-beam epitaxy with the plasma activation of nitrogen P. A. BushuykinA. V. NovikovV. Yu. Davydov XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1537 - 1541
Selective etching of Si, SiGe, Ge and its usage for increasing the efficiency of silicon solar cells N. A. BaidakovaV. A. VerbusN. Usami XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1542 - 1546
Manifestation of PT symmetry in the exciton spectra of quantum wells V. P. KochereshkoL. V. KotovaS. V. Ivanov XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1547 - 1551
Antimony segregation in Si layers grown by molecular beam epitaxy on Si wafers with different crystallographic orientations D. V. YurasovM. N. DrozdovA. V. Novikov XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1552 - 1556
Investigation of HgCdTe waveguide structures with quantum wells for long-wavelength stimulated emission V. V. RumyantsevA. M. KadykovV. I. Gavrilenko XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1557 - 1561
Activation conductivity in HgTe/CdHgTe quantum wells at integer Landau level filling factors: Role of the random potential L. S. BovkunA. V. IkonnikovV. I. Gavrilenko XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 08 December 2017 Pages: 1562 - 1570
Radiation-produced defects in germanium: Experimental data and models of defects V. V. EmtsevV. V. KozlovskiG. A. Oganesyan Electronic Properties of Semiconductors 08 December 2017 Pages: 1571 - 1587
Study and simulation of electron transport in Ga0.5ln0.5Sb based on Monte Carlo method A. A. El OuchdiB. BouazzaN. Massoum Electronic Properties of Semiconductors 08 December 2017 Pages: 1588 - 1591
Production and identification of highly photoconductive CdSe-based hybrid organic-inorganic multi-layer materials M. Yfanti-KattiF. Prokopos-ChouliarasZ. Loizos Surfaces, Interfaces, and Thin Films 08 December 2017 Pages: 1592 - 1596
Effect of Ag in CdSe thin films prepared using thermal evaporation T. C. M. SanthoshK. V. BangeraG. K. Shivakumar Surfaces, Interfaces, and Thin Films 08 December 2017 Pages: 1597 - 1603
Al-doped and pure ZnO thin films elaborated by sol–gel spin coating process for optoelectronic applications M. MaacheT. DeversA. Chala Surfaces, Interfaces, and Thin Films 08 December 2017 Pages: 1604 - 1610
Effect of high voltage electric field on structure and property of PEDOT:PSS film Jinling ZhangJuncheng Liu Surfaces, Interfaces, and Thin Films 08 December 2017 Pages: 1611 - 1614
A comparative study on the electronic and optical properties of Sb2Se3 thin film M. KamruzzamanChaoping LiuJ. A. Zapien Surfaces, Interfaces, and Thin Films 08 December 2017 Pages: 1615 - 1624
Charge density at the Al2O3/Si interface in Metal–lnsulator–Semiconductor devices: Semiclassical and quantum mechanical descriptions Slah HlaliNeila HizemAdel Kalboussi Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 08 December 2017 Pages: 1625 - 1633
Morphological and spectroscopic studies on the vertically aligned zinc oxide nanorods grown on low and high temperature deposited seed layer A. RayerfrancisBhargav P. BalajiC. Balaji Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena 08 December 2017 Pages: 1634 - 1640
Electrical properties and the determination of interface state density from I–V, C–f and G–f measurements in Ir/Ru/n-InGaN Schottky barrier diode R. PadmaV. Rajagopal Reddy Physics of Semiconductor Devices 08 December 2017 Pages: 1641 - 1649
Performance characteristics of p-channel FinFETs with varied Si-fin extension lengths for source and drain contacts Yue-Gie LiawWen-Shiang LiaoXuecheng Zou Physics of Semiconductor Devices 08 December 2017 Pages: 1650 - 1655
Single electron transistor: Energy-level broadening effect and thermionic contribution A. NasriA. BoubakerA. Kalboussi Physics of Semiconductor Devices 08 December 2017 Pages: 1656 - 1660
Patterning approach for detecting defect in device manufacturing Abhishek VikramVineeta Agarwal Fabrication, Treatment, and Testing of Materials and Structures 08 December 2017 Pages: 1661 - 1665
The effects of electron irradiation and thermal dependence measurements on 4H-SiC Schottky diode Sabuhi GaniyevM. Azim KhairiN. F. Hasbullah Fabrication, Treatment, and Testing of Materials and Structures 08 December 2017 Pages: 1666 - 1670