1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 17 July 2012 Pages: 389 - 390

2. Test Technology Newsletter

   News 10 July 2012 Pages: 391 - 392

   

3. ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus

   • Xiaoqin Sheng
   • Hans Kerkhoff
   • Guido Gronthoud

   OriginalPaper 31 August 2012 Pages: 393 - 404

   

4. BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting

   • Shreyas Sen
   • Aritra Banerjee
   • Abhijit Chatterjee

   OriginalPaper 06 July 2012 Pages: 405 - 419

   

5. Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits

   • Judit F. Freijedo
   • Jorge Semião
   • J. Paulo Teixeira

   OriginalPaper 01 May 2012 Pages: 421 - 434

   

6. On the Reuse of TLM Mutation Analysis at RTL

   • Valerio Guarnieri
   • Giuseppe Di Guglielmo
   • Raimund Ubar

   OriginalPaper 25 May 2012 Pages: 435 - 448

   

7. Cohesive Coverage Management: Simulation Meets Formal Methods

   • Aritra Hazra
   • Priyankar Ghosh
   • Partha Pratim Chakrabarti

   OriginalPaper 02 June 2012 Pages: 449 - 468

   

8. Time-Constraint-Aware Optimization of Assertions in Embedded Software

   • Viacheslav Izosimov
   • Giuseppe Di Guglielmo
   • Masahiro Fujita

   OriginalPaper 18 July 2012 Pages: 469 - 486

   

9. Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method

   • Michał Tadeusiewicz
   • Stanisław Hałgas

   OriginalPaper Open access 01 June 2012 Pages: 487 - 493

   

10. FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction

    • Nicola Bombieri
    • Franco Fummi
    • Valerio Guarnieri

    OriginalPaper 22 July 2012 Pages: 495 - 510

    

11. Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints

    • Taavi Viilukas
    • Anton Karputkin
    • Hideo Fujiwara

    OriginalPaper 13 July 2012 Pages: 511 - 521

    

12. Yield Improvement for 3D Wafer-to-Wafer Stacked Memories

    • Mottaqiallah Taouil
    • Said Hamdioui

    OriginalPaper Open access 21 July 2012 Pages: 523 - 534

    

13. A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

    • Badar-ud-din Ahmed
    • Wang Youren
    • Najam-ud-din Ahmed

    OriginalPaper 30 August 2012 Pages: 535 - 540

    

14. Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

    • Suraj Sindia
    • Vishwani D. Agrawal
    • Virendra Singh

    Letter 19 June 2012 Pages: 541 - 549