Volume 41, Issue 8 | Journal of Infrared, Millimeter, and Terahertz Waves

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Volume 41, Issue 8

August 2020

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11 articles in this issue

Terahertz Optical Constants of Solid CO₂
Bagvanth Reddy Sangala
Prathap Kumar Jharapla
G. Vaitheeswaran
OriginalPaper 18 June 2020 Pages: 871 - 879
Polarization Effects of Electro-optic Sampling and Over-rotation for High Field THz Detection
Gregory Bell
Michael Hilke
OriginalPaper 04 July 2020 Pages: 880 - 893
A Constant Corrugation Circular Waveguide for High-Pass Signal Diagnostics in ECEI System at 75–110 GHz
Hirenkumar V. Dhuda
Piyush N. Patel
Hiteshkumar B. Pandya
OriginalPaper 24 June 2020 Pages: 894 - 907
Frequency-Coded mm-Wave Tags for Self-Localization System Using Dielectric Resonators
A. Jiménez-Sáez
A. Alhaj-Abbas
K. Solbach
OriginalPaper Open access 24 June 2020 Pages: 908 - 925
Terahertz Time-of-Flight Tomography Beyond the Axial Resolution Limit: Autoregressive Spectral Estimation Based on the Modified Covariance Method
Min Zhai
Alexandre Locquet
D. S. Citrin
OriginalPaper 17 June 2020 Pages: 926 - 939
Non-uniformity Correction Algorithm for THz Array Detectors in High-Resolution Imaging Applications
Rungroj Jintamethasawat
Chayut Thanapirom
Kittipong Kasamsook
OriginalPaper 19 June 2020 Pages: 940 - 956
Observation of Anomalously Strong Penetration of Terahertz Electric Field Through Terahertz-Opaque Gold Films Into a GaAs/AlGaAs Quantum Well
S. D. Ganichev
S. N. Danilov
A. Ya. Shul’man
OriginalPaper Open access 26 June 2020 Pages: 957 - 978
Comparison of Terahertz, Microwave, and Laser Power Beaming Under Clear and Adverse Weather Conditions
Lou Rizzo
John F. Federici
Kate J. Duncan
OriginalPaper 30 June 2020 Pages: 979 - 996
Terahertz Van Atta Retroreflecting Arrays
Dhruvkumar Desai
Ian Gatley
John F. Federici
OriginalPaper 30 June 2020 Pages: 997 - 1008
Characterization of the Observed Electric Field and Molecular Relaxation Times for Millimeter-Wave Chirped Pulse Instrumentation
G. Dhont
D. Fontanari
R. Bocquet
OriginalPaper 01 July 2020 Pages: 1009 - 1021
Gyrotron-Based Technological Systems for Material Processing—Current Status and Prospects
Mikhail Glyavin
Svilen Sabchevski
Seitaro Mitsudo
OriginalPaper 01 July 2020 Pages: 1022 - 1037