Abstract
High concentrations of aluminum (Al) and nitrogen (N) dopants of 6H SiC have been achieved by a fast sublimation growth process. The Al–N co-doped 6H-SiC layer exhibits a strong light-blue photoluminescence emission at low temperatures due to emissions from DI centers and donor acceptor pairs (DAP). The photoluminescence quenching mechanisms of those emissions are different. The decrease of free carrier capture cross-section as temperature increases according to the cascade capture process causes quenching of the photoluminescence emission form DI centers. Emission from Al–N DAP centers exhibits an exponential quenching with activation energy of (95 ± 10) meV. This is attributed to a competing hole capture by non-radiative defect in a multiphonon emission process.
Similar content being viewed by others
References
T. Kimoto, J.A. Cooper, Fundamentals of Silicon Carbide Technology (Wiley, Singapore, 2014)
S. Kamiyama et al., J. Appl. Phys. 99, 093108 (2006)
W. Lu, Y. Ou, E.M. Fiordaliso, Y. Iwasa, V. Jokubavicius, M. Syväjärvi, S. Kamiyama, P.M. Petersen, H. Ou, Sci. Rep. 7, 9798 (2017)
H. Seo, A.L. Falk, P.V. Klimov, K.C. Miao, G. Galli, D.D. Awschalom, Nat. Commun. 7, 1 (2016)
T. Egilsson, J.P. Bergman, I.G. Ivanov, A. Henry, E. Janzén, Phys. Rev. B 59, 1956 (1999)
T.A.G. Eberlein, R. Jones, S. Öberg, P.R. Briddon, Phys. Rev. B 74, 1 (2006)
A. Fissel, W. Richter, J. Furthmüller, F. Bechstedt, Appl. Phys. Lett. 78, 2512 (2001)
M. Lax, Phys. Rev. 119, 1502 (1960)
A. Alkauskas, Q. Yan, C.G. Van De Walle, Phys. Rev. B 90, 1 (2014)
H. Ou, Y. Ou, A. Argyraki, S. Schimmel, M. Kaiser, P. Wellmann, M.K. Linnarsson, V. Jokubavicius, J. Sun, R. Liljedahl, M. Syväjärvi, Eur. Phys. J. B 87, 58 (2014)
M. Syväjärvi, R. Yakimova, P. Bhattacharya, R. Fornari, H. Kamimura, Encyclopedia-Comprehensive Semiconductor Science and Technology (Elsevier, Amsterdam, 2011)
M. Ikeda, H. Matsunami, T. Tanaka, J. Lumin. 20, 111 (1979)
V.V. Makarov, Sov. Phys. Solid State 13, 1974 (1972)
M. Ikeda, T. Hayakawa, S. Yamagiwa, H. Matsunami, T. Tanaka, J. Appl. Phys. 50, 8215 (1979)
M.V.B. Pinheiro, E. Rauls, U. Gerstmann, S. Greulich-Weber, H. Overhof, J.M. Spaeth, Phys. Rev. B 70, 1 (2004)
E. Rauls, U. Gerstmann, M.V.B. Pinheiro, S. Greulich-Weber, J.M. Spaeth, Mater. Sci. Forum 483–485, 465 (2005)
M. Ikeda, H. Matsunami, T. Tanaka, Jpn. J. Appl. Phys. 19, 1201 (1980)
W. Suttrop, G. Pensl, P. Lanig, Appl. Phys. A Solids Surfaces 51, 231 (1990)
P. Norton, T. Braggins, H. Levinstein, Phys. Rev. Lett. 30, 488 (1973)
V.N. Abakumov, V.I. Perel', I.N. Yassievich, Sov. Phys. Semicond. 1, 12 (1978)
L. Storasta, F.H.C. Carlsson, S.G. Sridhara, J.P. Bergman, A. Henry, T. Egilsson, A. Hallén, E. Janzén, Appl. Phys. Lett. 78, 46 (2001)
V.N. Abakumov, V.I. Perel, I.N. Yassievich, Sov. Phys. JETP 45, 354 (1977)
A.J. Suzuki, Electrochem. Soc. 124, 241 (1977)
M. Ikeda, H. Matsunami, T. Tanaka, Phys. Rev. B 22, 2842 (1980)
D.V. Lang, C.H. Henry, Phys. Rev. Lett. 35, 1525 (1975)
L. Shi, L.W. Wang, Phys. Rev. Lett. 109, 1 (2012)
Acknowledgements
This work has been financially supported by Innovation Fund Denmark (No. 4106-00018B) and Independent Research Fund Denmark (No. 8022-00294B).
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Tarekegne, A.T., Norrman, K., Jokubavicius, V. et al. Impacts of carrier capture processes in the thermal quenching of photoluminescence in Al–N co-doped SiC. Appl. Phys. B 125, 172 (2019). https://doi.org/10.1007/s00340-019-7279-8
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s00340-019-7279-8