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Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials

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Scanning Transmission Electron Microscopy

Abstract

The success of aberration correction in the scanning transmission electron microscope (STEM) is revolutionizing the study of complex oxide materials, especially transition metal oxides. These are fascinating systems that exhibit the most disparate physical behaviors such as colossal magnetoresistance, orbital and/or charge ordering, magnetoelectronic phase separation or high Tc superconductivity to just name a few. Thanks to their relatively large lattice parameters and the fact that both O and transition metals exhibit absorption edges well within the reach of modern electron energy loss spectrometer (EELS) optics, they are ideal systems for such types of electron microscopy studies. Since many of the aforementioned phenomena exhibit characteristic length scales in the nanometer regime, they are affected by reduced dimensionality (e.g., thin films or heterostructures), proximity to other materials, or depend on nanometric active regions (e.g., defects, interfaces, etc.). Understanding such phenomena must therefore rely heavily on probes capable of studying simultaneously the structure, chemistry and electronic properties with atomic resolution in real space. In this chapter we will review a number of applications of aberration corrected STEM-EELS to transition metal oxides, mainly those with the perovskite structure. We will go over the current state-of-the-art of the techniques, capabilities, sensitivity and interpretation of measurements and apply this knowledge to the study of bulk and nanoscale systems, thin films and interfaces based on materials such as cuprates, titanates, manganites and cobaltites.

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Notes

  1. 1.

    Notice: This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes.

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Acknowledgments

The authors are most grateful to all of our colleagues and collaborators who made this work possible through the years. We cannot name all of them here, but a special word of gratitude goes to R. Sanchez, A.R. Lupini, M.F. Chisholm, J.T. Luck, W.H., Sides, W. Luo, S.T. Pantelides, J. Santamaria, J. Garcia-Barriocanal, Z. Sefrioui, C. Leon, A. Rivera-Calzada, N. Shibata, Y. Ikuhara, T. Mizoguchi, K.M. Krishnan, K. Griffin-Roberts, S.N. Rashkeev, D.G. Mandrus, H.M. Christen, M. Biegalski, M.A. Torija, M. Sharma, C. Leighton, J. Tao, R. Bertacco and his group, M. Watanabe, R. Klie, L.J. Allen, S.D. Findlay, P.D. Nellist, and of course O.L. Krivanek, N. Dellby, M. Murfitt, and everybody at Nion Co. Research at ORNL sponsored by the Materials Sciences and Engineering Division, Office of Science, US DOE, and research at Universidad Complutense supported by the European Research Council Starting Investigator Award.

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Authors and Affiliations

  1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

    Maria Varela, Jaume Gazquez, Timothy J. Pennycook, Cesar Magen, Mark P. Oxley & Stephen J. Pennycook

  2. Departament de Física Aplicada III, University Complutense of Madrid, Madrid, Spain

    Maria Varela & Jaume Gazquez

  3. Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA

    Timothy J. Pennycook & Mark P. Oxley

  4. Instituto de Nanociencia de Aragon-ARAID and Departamento de Física de la Materia Condensada, Universidad de Zaragoza, Zaragoza, Spain

    Cesar Magen

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  1. Maria Varela
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Correspondence to Maria Varela .

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  1. Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831-6056, Tennessee, USA

    Stephen J. Pennycook

  2. , Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom

    Peter D. Nellist

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Varela, M., Gazquez, J., Pennycook, T.J., Magen, C., Oxley, M.P., Pennycook, S.J. (2011). Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials. In: Pennycook, S., Nellist, P. (eds) Scanning Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7200-2_10

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