Abstract
The influence of the He, Ne and Ar on Xe plasma pumped by capillary discharge process is studied theoretically and experimentally. The charge-state populations and average ionization of Xe as a function of electron temperature for pure Xe and mixed gases are calculated with a collision-radiation model. The emission of Xe10+ 4d 8-4d 75p 13.5 nm in 2% bandwidth is obtained by a EUV emission monitor (E-Mon). Additional He/Ne/Ar gas can influence on the time scale and the intensity of the appearance for the E-Mon signals by effecting the electron density and temperature.
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M.A. Klosner, W.T. Silfvast, Opt. lett. 23, 1609 (1998)
U. Stamm, J. Kleinschmidt, K. Gäbel, H. Birner, I. Ahmad, Conference on Emerging Lithographic Technologies VIII, 2004, Vol. 5374, p. 133
P.A.C. Jansson, B.A.M. Hansson, Appl. Phys. Lett. 84, 2256 (2004)
T. Inoue, H. Okino, P.E. Nica, S. Amano, S. Miyamoto, T. Mochizuki, Rev. Sci. Instrum. 78, 105105 (2007)
M. McGeoch, Appl. Opt. 37, 1651 (1998)
I.V. Fomenkov, N. B wering, C.L. Rettig, S.T. Melnychuk, I.R. Oliver, J.R. Hoffman, O.V. Khodykin, R.M. Ness, W.N. Partlo, J. Phys. D 37, 3266 (2004)
K. Nowakowska-Langier, L. Jakubowski, E.O. Baronova, K. Czaus, M. Rabinski, M.J. Jakubowski, Eur. Phys. J. D 54, 377 (2009)
K. Bergmann, S. Danylyuk, L. Juschkin, J. Appl. Phys. 106, 073309 (2009)
N.R. Fornaciari, H. Bender, D. Buchenauer, M.P. Kanouff, S. Karim, G.D. Kubiak, C.D. Moen, G.M. Shimkaveg, W.T. Silfvast, K.D. Stewart, Conference on Emerging Lithographic Technologies V, 2001, Vol. 4343, p. 226
F. Gilleron, M. Poirier, T. Blenski, M. Schmidt, T. Ceccotti, J. Appl. Phys. 94, 2086 (2003)
C.H. Zhang, P. Lv, S. Katsuki, H. Akiyama, in Proc. of the 22nd Canadian Conference on Electrical and Computer Engineering, St John’s, Newfoundland, Canada, 2009, p. 958
M. Poirier, T. Blenski, F. de Gaufridy de Dortan, F. Gilleron, J. Quant. Spectrosc. Radiat. Transfer 99, 482 (2006)
D. Colombant, G. Tonon, J. Appl. Phys. 44, 3524 (1973)
J. Zeng, C. Gao, J. Yuan, Eur. Phys. J. D 60, 309 (2010)
Y. Teramoto, H. Sato, K. Bessho, K. Miyauchi, M. Ikeuchi, K. Okubo, M. Yoshioka, K. Toyoda, Conference on Emerging Lithographic Technologies VII, 2009, Vol. 5037, p. 767
Y. Zhao, Q. Wang, Y. Xie, Y. Cheng, B. Luan, J. Plasma Phys. 74, 839 (2008)
Y. Zhao, Y. Cheng, B. Luan, Y. Wu, Q. Wang, J. Phys. D 39, 342 (2006)
B. Huang, Y. Takimoto, M. Watanabe, E. Hotta, Jpn J. Appl. Phys. 50, 06GB09 (2011)
Q. Zhu, T. Muto, J. Yamada, N. Kishi, M. Watanabe, J. Appl. Phys. 110, 123302 (2011)
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Xu, Q., Zhao, Y., Liu, Y. et al. Effect of He/Ne/Ar on EUV emission and Xe plasma pumped by capillary discharge. Eur. Phys. J. D 67, 125 (2013). https://doi.org/10.1140/epjd/e2013-30500-5
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DOI: https://doi.org/10.1140/epjd/e2013-30500-5