Abstract
Experimental data on field ion emission under high partial pressures of water vapor at room temperature are reported. A method for obtaining low-field ion images in the presence of water vapor is proposed and the potentialities, limitations, and prospects of using images in microscopy are considered.
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References
E. W. Müller and T. T. Tzong, Field Ion Microscopy (Elsevier, New York, 1969; Metallurgiya, Moscow, 1972).
E. W. Müller, Usp. Fiz. Nauk 77, 550 (1962); E. W. Müller, Adv. Electron. Electron Phys. 13, 82 (1960).
N. A. Blashenkov, A. K. Lavrent’ev, and V. N. Shrednik, Pis’ma Zh. Tekh. Fiz. 30(12), 50 (2004) [Tech. Phys. Lett. 30, 509 (2004)].
M. Bruckner and H. Morgner, Europhys. Lett. 18, 469 (1992).
V. A. Ksenofontov, V. B. Kul’ko, and I. M. Mikhailovskii, Vopr. At. Nauki Tekh., Ser.: Fiz. Rad. Povrezhd. Rad. Materialoved, No. 3, 81 (1980).
V. A. Ksenofontov, E. V. Sadanov, I. M. Mikhailovskii, et al., Pis’ma Zh. Tekh. Fiz. 31(20), 76 (2005) [Tech. Phys. Lett. 31, 891 (2005)].
H. J. Kreuzer, Surf. Interface Anal. 36, 372 (2004).
I. M. Mikhailovskij, N. Wanderka, V. A. Ksenofontov, et al., Nanotechnology 18, 475 705 (2007).
M. D. Gabovich, Usp. Fiz. Nauk 140, 137 (1983) [Sov. Phys. Usp. 26, 447 (1983)].
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Original Russian Text © V.A. Ksenofontov, E.V. Sadanov, O.A. Velikodnaya, 2009, published in Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 79, No. 4, pp. 136–141.