Abstract
Low-energy electron microscopy (LEEM) images a beam of low-energy electrons that have been reflected from a sample. The technique characterizes the sample’s surface in real-space with nanometer-scale lateral resolution. Through a variety of contrast mechanisms, different aspects of the surface can be imaged, including the distribution of different phases and the location of atomic steps. LEEM instrumentation can also acquire electron diffraction patterns from local regions of the surface. The ability to acquire images quickly during temperature changes, while depositing films and exposing materials to reactive gases makes LEEM extremely useful for studying dynamical processes on surfaces. New developments include aberration correction systems for improved spatial resolution and bright spin-polarized electron sources.
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Notes
- 1.
In fact PEEM is more forgiving in terms of the samples that can be analyzed—some electrons are photoemitted normal to the surface plane even from very rough surfaces or from surfaces whose facets are not in the surface plane. In contrast, LEEM works best on relatively flat surfaces whose facets lie mainly within the surface plane. (For surfaces whose facets are not orthogonal to the electron beam, the specularly reflected electron beam is not transmitted through the imaging column under normal conditions.)
- 2.
If properly tuned, cathode preparation is routine and lifetimes are several days.
- 3.
- 4.
The opposite magnetic fields cancel the spin rotation of an individual dipole so that an electron transiting the complete beam separator does not change spin direction.
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Acknowledgements
JdlF acknowledges support from the Spanish Ministry of Science and Innovation through Project No. MAT2009-14578-C03. KFM acknowledges support from the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering of the US DOE under Contract No. DE-AC04-94AL85000.
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de la Figuera, J., McCarty, K.F. (2013). Low-Energy Electron Microscopy. In: Bracco, G., Holst, B. (eds) Surface Science Techniques. Springer Series in Surface Sciences, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34243-1_18
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