Abstract
The understanding of noise in analog sampled data systems is vital for the design of high resolution circuitry in the discrete time domain. In this paper a general description of sampled and held noise is presened. The noise calculations are verified by measurements on an analog delay line implemented using switched-current (SI) technique. The SI delay line is based on a new topology current copier (CCOP). For the verification of the theory a new measurement technique is used. This technique enables one to measure the power spectral density of sampled and held noise which is below the continuous time noise floor.
Similar content being viewed by others
References
Ivan H. H. Jørgensen and Gudmundur Bogason, “Design of a 3rd Order Micro Power Switched Current ΣΔ-Modulator.” The third International Conference on Electronics, Circuits and Systems, ICECS'96, Rhodos, Greece. 13–16, 1996, 2, pp. 948-951.
Ivan H. H. Jørgensen and Gudmundur Bogason, “A 3rd Order Low Power Switched Current ΣΔ-Modulator for Voice Band Applications.” 1997 IEEE International Symposium on Circuits and Systems ISCAS'97, Hong Kong, proceedings, I pp. 69-72.
Ivan H. H. Jørgensen, “Current Mode Data Converters for Sensor Systems.” Ph.D. Thesis, Dept. of Information Technology, Technical University of Denmark (DTU), 1997.
Jonathan H. Fisher, “Noise Sources and Calculation Technique for Switched Capacitor Filters.” IEEE Journal of Solid-state Circuits, SC-17, pp. 742-752, 1982.
Gudmundur Bogason, “Switched Current Circuits, Design, Optimization and Applications.” Ph.D. Thesis, Electronics Institute, Technical University of Denmark (DTU), 1996.
C. Toumazou, J. B. Hughes, and N. C. Battersby, SWITCHED-CURRENT—an analogue technique for digital technology. Peter Peregrinus Ltd., 1993.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Jørgensen, I.H.H., Bogason, G. Noise Analysis of Switched-Current Circuits. Analog Integrated Circuits and Signal Processing 18, 69–77 (1999). https://doi.org/10.1023/A:1008355620630
Issue Date:
DOI: https://doi.org/10.1023/A:1008355620630