Skip to main content
Log in

Formulae for the secondary electron yield and total stopping power from 0.8 keV to 10 keV for metals

  • Published:
Pramana Aims and scope Submit manuscript

Abstract

Based on the range–energy relationship, the characteristics of secondary electron emission, some relationship between the secondary electron yield δ and experimental results, the universal formulae for δ 0.8−2 (the subscript indicates that the energy range of primary energy at the surface W po is from 0.8 keV to 2 keV) and δ 2−10 for metals were deduced. The δ 0.8−10 calculated with the universal formulae and the δ 0.8−10 measured experimentally were compared, and the scattering of δ for the same metal was analysed. Finally, we concluded that the formulae were universal for δ 0.8−10 for metals. On the basis of some relationship between parameters of δ, we deduce a formula for expressing total stopping power S 0.8−10 as a function of S 10−30, δ 0.8−10, δ 10−30, backscattered coefficient η 0.8−10, η 10−30 and W po. The calculated S 0.8−10 were compared with the values measured experimentally and it was concluded that the formula to estimate S 0.8−10 was universal for metals.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Figure 9
Figure 10
Figure 11

Similar content being viewed by others

References

  1. A Hussain, A Begum and A Rahman, Indian J. Phys. 86, 697 (2012)

  2. H A Bioki and M B Zarandi, Indian J. Phys. 86, 439 (2012)

  3. N Goyal, R Shukla and M Lal, Pramana–J. Phys. 40, 377 (1993)

  4. N Goyal, Pramana–J. Phys. 40, 97 (1993)

  5. A G Xie, S R Xiao and H Y Wu, Indian J. Phys. 87, 1093 (2013)

  6. J Olesik and B Całusiński, Thin Solid Films 238, 271 (1994)

  7. A G Xie, C Q Li and T B Wang, Mod. Phys. Lett. B 23, 2331 (2009)

  8. A G Xie, H F Zhao, B Song and Y J Pei, Nucl. Instrum. Methods B 267, 1761 (2009)

  9. K Kanaya and H Kawakatsu, J. Phys. D 5, 1727 (1972)

  10. S Samarin, O M Artamonov, A D Sergeant and J F Williams, Surf. Sci. 579, 166 (2005)

  11. H Seiler, J. Appl. Phys. 54, R1 (1983)

  12. K Nishimura, J Kawata and K Ohya, Nucl. Instrum. Methods B 164–165, 903 (2000)

  13. A A Suvorova and S Samarin, Surf. Sci. 601, 4428 (2007)

  14. K Yassin, A Seidman and N Croitoru, Thin Solid Films 217, 193 (1992)

  15. F Blanco and F Arqueros, Phys. Lett. A 345, 355 (2005)

  16. J Cazaux, J. Appl. Phys. 110, 024906 (2011)

  17. Y Masaaki, T Keiji and K Hiroaki, Appl. Surf. Sci. 169–170, 78 (2001)

  18. Y Kazami, K Junichiro and O Norio, Appl. Surf. Sci. 256, 958 (2009)

  19. A G Xie, Y J Yao, J Su and J Zhang, Nucl. Instrum. Methods B 268, 2565 (2010)

  20. http://physics.nist.gov/PhysRefData/Star/Text/appendix.html

  21. A G Xie, J Zhang and T B Wang, Chin. Phys. Lett. 28, 097901 (2011)

  22. S G Jeon, J I Kim and G J Kim, J. Korean Phys. Soc. 57, 489 (2010)

  23. http://eesd.mc-set.com/lb_load.php

  24. S Luo, X Zhang and D C Joy, Rad. Eff. Defects. Sol. 117, 235 (1991)

  25. K O Al-Ahmad and D E Watt, J. Phys. D: Appl. Phys. 16, 2257 (1983)

  26. J A LaVerne and A Mozumder, J. Phys. Chem. 89, 4219 (1985)

  27. http://physics.nist.gov/PhysRefData/Star/Text/ESTAR.html

  28. http://www.srim.org/SREM.htm

  29. A G Xie, M Lai and C Y Zhang, J. Korean Phys. Soc. 62, 127 (2013)

  30. H Seiler, Z. Angew Phys. 22, 249 (1967)

  31. R E Simon and B F Williams, J. IEEE Trans. Nucl. Sci. NS-15, 167 (1968)

  32. J Buchholz, Z. Phys. 227, 440 (1969)

  33. P L Copeland, Phys. Rev. 58, 604 (1940)

  34. J R Young, Phys. Rev. 103, 292 (1956)

  35. J R Young, J. Appl. Phys. 28, 524 (1957)

  36. I M Bronshtein and S S Denisov, Sov. Phys. Solid State 9, 731 (1967)

  37. S Ono and K Kanaya, J. Phys. D 12, 619 (1979)

  38. H Drescher, L Reimer and H Seidel, Z. Angew Phys. 29, 331 (1970)

  39. S M L Prokopenko and J G Laframboise, Proc. Spacecraft Charging Technology Conference edited by C P Pike and R R Lovell (Lewis Research Center, Cleveland, Ohio, 1977) 369

  40. E J Sternglass, Phys. Rev. 95, 352 (1954)

  41. http://www.mc-set.com/science/eesd/show_images.php

  42. R Shimizu, J. Appl. Phys. 45, 2107 (1974)

  43. R Bongeler, U Golla, M Kussens, L Reimer, B Schendler, R Senkel and M Spranck, Scanning 1, 15 (1993)

  44. L Reimer and C Tolkamp, Scanning 3, 35 (1980)

  45. W Reuter, Proceedings of the Six International Conference on X-ray Optics and Microanalysis (University of Tokyo Press, Tokyo, 1972) p. 121

  46. A van der Ziel, Solid state physical electronics, 2nd edn (Prentice-Hall, Englewood Cliffs, 1968) p. 172

  47. J Cazaux, Appl. Surf. Sci. 257, 1002 (2010)

  48. T E Rothwell and P E Russell, Microbeam analysis–1988 edited by D E Newbury (San Francisco Press, San Francisco, 1988) p. 149

  49. I M Bronstein and B S Fraiman, in: Vtorichnaya Elektronnaya Emissiya (Nauka, Moskva, 1969) p. 340

  50. K Kanaya and S Ono, in: Electron beam interactions with solids edited by D Kyser (SEM Inc., Chicago, 1984) p. 69

  51. S Thomas and E B Pattinson, Brit. J. Appl. Phys. II-2, 1539 (1969)

  52. D A Moncrieff and P R Barker, Scanning 1, 195 (1976)

  53. M Kanter, Phys. Rev. 121, 1677 (1961)

Download references

Acknowledgements

This project is supported by the National Natural Science Foundation of China (No. 11473049). The present research has been conducted by the research grant of Kwangwoon University in 2015.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to A G XIE.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

XIE, A.G., XIAO, S.Y. & WANG, L. Formulae for the secondary electron yield and total stopping power from 0.8 keV to 10 keV for metals. Pramana - J Phys 86, 1127–1141 (2016). https://doi.org/10.1007/s12043-015-1119-0

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s12043-015-1119-0

Keywords

PACS Nos

Navigation