Abstract
Controlling the critical temperature (\(T_{C}\)) of Ti/Au bilayers is vital in the development of practical TES detectors. Previously empirical studies have been done on aging effects in Ti/Au and other superconducting bilayers but no link with theory has been made. Here we attempt to explain the change in \(T_{C}\) with a diffusion mechanism. The change in \(T_{C}\) has been measured for a set of Ti/Au bilayer samples that have been given a variety of bake-out treatments, where we found a trend that can be partly explained by an inter-diffusion mechanism. With an empirical model based on diffusion a safe zone can be defined as a region of bake-out treatments, where the \(T_{C}\) is not affected beyond the requirements. This will shine light on the bake-out and the storage condition boundaries of these detectors.
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Acknowledgments
We would like to thank M. Schoemans, R. de la Rie and J. Dercksen for technical assistance.
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van der Heijden, N.J., Khosropanah, P., van der Kuur, J. et al. Diffusion Behaviour in Superconducting Ti/Au bilayers for SAFARI TES Detectors. J Low Temp Phys 176, 370–375 (2014). https://doi.org/10.1007/s10909-014-1158-9
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DOI: https://doi.org/10.1007/s10909-014-1158-9