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Micromorphology and fractal analysis of nickel–carbon composite thin films

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Abstract

In this study nickel–carbon (Ni–C) nanocomposite thin films composed of Ni nanoparticles with different average sizes embedded in amorphous hydrogenated carbon, were prepared through the combination of radio frequency sputtering and plasma enhanced chemical vapor deposition techniques. Such samples were used as experimental models to study the three dimensional surface morphology properties in thin films by atomic force microscopy imaging and fractal analysis over square areas of 1 μm × 1 μm. The deposition time was varied at 7, 10 and 13 min, respectively, to study changes in the properties of the obtained films. The studied samples exhibited fractal properties characterized by fractal dimensions dependent on the deposition time with values between 2.43 ± 0.01 and 2.71 ± 0.01.

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Authors and Affiliations

  1. Discipline of Descriptive Geometry and Engineering Graphics, Department of AET, Faculty of Mechanical Engineering, Technical University of Cluj-Napoca, 103-105 B-dulMuncii St., 400641, Cluj-Napoca, Cluj, Romania

    Ştefan Ţălu

  2. Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Pedro de Alba s/n, 66455, San Nicolás de los Garza, Nuevo León, Mexico

    Carlos Luna

  3. Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran

    Azin Ahmadpourian, Ali Arman & Behroz Safibonab

  4. Institut National de la RechercheScientifique (INRS), 1650 Boulevard Lionel-Boulet, Varennes, QC, J3X 1P7, Canada

    Amine Achour

  5. Young Researchers and Elite Club, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran

    Sirvan Naderi

  6. Physics Department, Faculty of Science, Malayer University, Malayer, Iran

    Nader Ghobadi

  7. Department of Biomedical Computer Systems, Faculty of Computer Science and Materials Science, Institute of Informatics, University of Silesia, Będzińska 39, 41-205, Sosnowiec, Poland

    Sebastian Stach

Authors
  1. Ştefan Ţălu
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  2. Carlos Luna
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  3. Azin Ahmadpourian
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  4. Amine Achour
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  5. Ali Arman
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  6. Sirvan Naderi
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  7. Nader Ghobadi
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  8. Sebastian Stach
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  9. Behroz Safibonab
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Corresponding author

Correspondence to Ali Arman.

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Ţălu, Ş., Luna, C., Ahmadpourian, A. et al. Micromorphology and fractal analysis of nickel–carbon composite thin films. J Mater Sci: Mater Electron 27, 11425–11431 (2016). https://doi.org/10.1007/s10854-016-5268-9

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  • DOI: https://doi.org/10.1007/s10854-016-5268-9

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