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Determination of Structural Parameters of Thin-Film Photocatalytic Materials by BDS

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Abstract

A method for determination of structural parameters of some thin-film photocatalytic materials is presented. The analysis was based on the material’s thermal parameter dependences on its surface structure or porosity and was thus performed by the use of beam deflection spectroscopy (BDS) supported by theoretical analysis made in the framework of complex geometrical optics. The results obtained by BDS were than compared with those received on the basis of AFM and SEM measurements and found to be in good agreement.

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Acknowledgments

Authors would like to thank the Slovenian Research Agency for funding this work through research Grants Z7-4325-1540: “Characterization of semiconductor nanomaterials by determining their optical and thermal parameters using the photothermal effect” and P1-0034: “Analytics and chemical characterization of materials and processes.” The photocatalytic films were kindly provided by Prof. Urška Lavrenčič-Štangar and her group at the University of Nova Gorica.

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  1. Laboratory of Environmental Research, University of Nova Gorica, Vipavska 13, 5000, Nova Gorica, Slovenia

    Dorota Korte & Mladen Franko

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  1. Dorota Korte
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  2. Mladen Franko
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Correspondence to Dorota Korte.

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Korte, D., Franko, M. Determination of Structural Parameters of Thin-Film Photocatalytic Materials by BDS. Int J Thermophys 36, 2462–2474 (2015). https://doi.org/10.1007/s10765-015-1923-2

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  • DOI: https://doi.org/10.1007/s10765-015-1923-2

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