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The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

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Abstract

Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.

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Acknowledgements

Thanks go to Carsten Reinhardt from the Laserzentrum Hannover for helpful discussion. This work was funded by the German Research Foundation (DFG) through Priority Program 1391 "Ultrafast Nanooptics" as well as by the Danish Council for Independent Research (FTP project ANAP, contract No. 09-072949).

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Authors and Affiliations

  1. IEAP, University of Kiel, Leibnizstr. 19, 24118, Kiel, Germany

    Christoph Lemke, Till Leißner, Alwin Klick, Jörn Willers Radke, Martin Thomaschewski & Michael Bauer

  2. Mads Clausen Institute, University of Southern Denmark, NanoSYD Alsion 2, 6400, Sønderborg, Denmark

    Jacek Fiutowski, Jakob Kjelstrup-Hansen & Horst-Günter Rubahn

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  1. Christoph Lemke
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  2. Till Leißner
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Correspondence to Christoph Lemke.

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Lemke, C., Leißner, T., Klick, A. et al. The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces. Appl. Phys. B 116, 585–591 (2014). https://doi.org/10.1007/s00340-013-5737-2

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