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Effects of oxidation and nitridation temperatures on electrical properties of sputtered Zr thin film based on Si in N2O ambient

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Abstract

The effects of oxidation and nitridation temperatures (500–1100°C) on metal-oxide-semiconductor characteristics of sputtered Zr thin film on Si in N2O ambient have been systematically investigated. The sample being oxidized and nitrided at 700°C has demonstrated the highest effective dielectric constant of 21.82 and electrical breakdown field of 13.6 MV cm−1 at a current density of 10−6 A cm−2. This is attributed to the lowest effective oxide charge, interface-trap density, and total interface-trap density of the oxide and the highest barrier height of conduction band offset between the oxide and semiconductor when compared with others.

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Authors and Affiliations

  1. Energy Efficient & Sustainable Semiconductor Research Group, School of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia, 14300 Nibong Tebal, Seberang Perai Selatan, Penang, Malaysia

    Yew Hoong Wong & Kuan Yew Cheong

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  1. Yew Hoong Wong
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  2. Kuan Yew Cheong
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Correspondence to Kuan Yew Cheong.

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Wong, Y.H., Cheong, K.Y. Effects of oxidation and nitridation temperatures on electrical properties of sputtered Zr thin film based on Si in N2O ambient. Electron. Mater. Lett. 8, 47–51 (2012). https://doi.org/10.1007/s13391-011-1067-x

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  • DOI: https://doi.org/10.1007/s13391-011-1067-x

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