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Thickness of Anodic Titanium Oxides as a Function of Crystallographic Orientation of the Substrate

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Abstract

This work deals with the anodization-driven oxidation of titanium, studied as a function of the crystallographic orientation of the crystal grains of the substrate. On a polycrystalline surface, different colors appear on the surface after anodization under galvanostatic conditions at a fixed potential. The color of the oxides on individual grains is correlated to an independent set of reflectometry data relating color to thickness, to infer the approximate thickness of the oxide layer grown on each grain in the polycrystal. These data are further related to the crystallographic orientation of each grain as assessed by electron backscatter diffraction measurements. It is shown that crystallographic orientations close to (0001) lead to relatively slower oxidation as compared with inclined orientations.

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Acknowledgments

One of the authors (MVD) acknowledges the “Progetto Roberto Rocca” for promoting the collaboration between MIT and Politecnico di Milano and supporting this project. CAS acknowledges the support of the United States National Science Foundation under Grant No. DMR-0346848. Part of this work was performed at the Center for Nanoscale Systems (CNS), a member of the National Nanotechnology Infrastructure Network (NNIN), which is supported by the National Science Foundation under NSF Award No. ECS-0335765. CNS is part of the Faculty of Arts and Sciences at Harvard University.

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Correspondence to C.A. Schuh.

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Manuscript submitted December 12, 2007.

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Diamanti, M., Pedeferri, M. & Schuh, C. Thickness of Anodic Titanium Oxides as a Function of Crystallographic Orientation of the Substrate. Metall Mater Trans A 39, 2143–2147 (2008). https://doi.org/10.1007/s11661-008-9558-6

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