Abstract
Atom probe tomography is used to measure interfacial and grain boundary segregation in the thermally grown oxide layers found on thermal barrier coatings formed by isothermal heat treatments at 1,100 °C. Segregation of Zr, Hf, Y, and minor elements at the metal/oxide interfaces, oxide grain boundaries and oxide dislocations are observed, quantified and rationalised. The implications of the findings are discussed.
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This work was partly supported by The University of Michigan College of Engineering.
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Chen, Y., Reed, R.C. & Marquis, E.A. Interfacial Solute Segregation in the Thermally Grown Oxide of Thermal Barrier Coating Structures. Oxid Met 82, 457–467 (2014). https://doi.org/10.1007/s11085-014-9502-7
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DOI: https://doi.org/10.1007/s11085-014-9502-7