Skip to main content
SpringerLink
Log in

High-throughput measurements of materials properties

  • Large Datasets in Materials Science, Part I
  • Research Summary
  • Published:
JOM Aims and scope Submit manuscript

Abstract

By taking advantage of compositional variations and the formation of intermetallic compounds in diffusion couples and diffusion multiples as well as newly developed micron-scale resolution measurement techniques, one can now perform localized measurements of several materials properties as a function of composition and phase in a high-throughput fashion that is much more effective and systematic than using individual alloy samples.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. J.-C. Zhao, Adv. Eng. Mater., 3 (2001), pp. 143–147.

    Article  CAS  Google Scholar 

  2. J.-C. Zhao, J. Mater. Res., 16 (2001), pp. 1565–1578.

    Article  CAS  Google Scholar 

  3. J.-C. Zhao, Annu. Rev. Mater. Res., 35 (2005), pp. 51–73.

    Article  CAS  Google Scholar 

  4. W.C. Oliver and G.M. Pharr, J. Mater. Res., 7 (1992), pp. 1564–1580.

    Article  CAS  Google Scholar 

  5. J.-C. Zhao, M.R. Jackson, L.A. Peluso, and L.N. Brewer, JOM, 54(7) (2002), pp. 42–45.

    Article  CAS  Google Scholar 

  6. D.J. Dingley and V. Randle, J. Mater. Sci., 27 (1992), pp. 4545–4566.

    Article  CAS  Google Scholar 

  7. A.J. Schwartz, M. Kumar, and B.L. Adams, eds., Electron Backscatter Diffraction in Materials Science (New York: Kluwer Academic/Plenum, 2000).

    Google Scholar 

  8. J.-C. Zhao, J. Mater. Sci., 12 (2004), pp. 3913–3925.

    Article  Google Scholar 

  9. D.G. Cahill, Rev. Sci. Instr., 75 (2004), pp. 5119–5123.

    Article  CAS  Google Scholar 

  10. S. Huxtable, D.G. Cahill, V. Fauconnier, J.O. White, and J.-C. Zhao, Nature Mater., 3 (2004), pp. 298–301.

    Article  CAS  Google Scholar 

  11. X. Zheng, D.G. Cahill, and J.-C. Zhao, Adv. Eng. Mater., 7 (2005), pp. 622–626.

    Article  CAS  Google Scholar 

  12. J.-C. Zhao, Prog. Mater. Sci., 51 (2006), pp. 557–631.

    Article  Google Scholar 

  13. X. Zheng, D.G. Cahill, R. Weaver, and J.-C. Zhao, J. Appl. Phys., 104 (2008), 073509.

    Article  Google Scholar 

  14. C. E. Guillaume, Proc. Phys. Soc. London, 32 (1920), pp. 374–404.

    Article  CAS  Google Scholar 

  15. X. Zheng, D.G. Cahill, and J.-C. Zhao, Acta Mater., 58 (2010), pp. 1236–1241.

    Article  CAS  Google Scholar 

  16. D.G. Cahill, X. Zheng, and J.-C. Zhao, J. Thermal Stresses, 33 (2010), pp. 9–14.

    Article  Google Scholar 

  17. T.-Y. Lee, K. Ohmori, C.-S. Shin, D.G. Cahill, I. Petrov, and J.E. Greene, Phys. Rev. B71 (2005), 144106.

    Google Scholar 

  18. A.J. Schmidt, R. Cheaito, and M. Chiesa, Rev. Sci. Instr., 80 (2009), 094901.

    Article  Google Scholar 

  19. M.F. Doerner and W.D. Nix, J. Mater. Res., 1 (1986), pp. 601–609.

    Article  Google Scholar 

  20. I. Takeuchi, W. Yang, K.-S. Chang, M.A. Aronova, T. Venkatesan, R.D. Vispute, and L.A. Bendersky, J. Appl. Phys., 94 (2003), pp. 7336–7340.

    Article  CAS  Google Scholar 

  21. T. Fukumura, M. Ohtani, M. Kawasaki, Y. Okimoto, T. Kageyama, T. Koida, T. Hasegawa, Y. Tokura, and H. Koinuma, Appl. Phys. Lett., 77 (2000), pp. 3426–3428.

    Article  CAS  Google Scholar 

  22. T. Wei, X.-D. Xiang, W.G. Wallace-Freedman, and P.G. Schultz, Appl. Phys. Lett., 68 (1996), pp. 3506–3508.

    Article  CAS  Google Scholar 

  23. C. Gao, T. Wei, F. Duewer, Y. Lu, and X.-D. Xiang, Appl. Phys. Lett., 71 (1997), pp. 1872–1874.

    Article  CAS  Google Scholar 

  24. P. Boggild, F. Grey, T. Hassenkam, D.R. Greve, and T. Bjornholm, Adv. Mater., 12 (2000), pp. 947–949.

    Article  CAS  Google Scholar 

  25. S.-Y. Chung and Y.-M. Chiang, Electroch. Solid-State Lett., 6 (2003), pp. A278–A281.

    Article  CAS  Google Scholar 

Download references

Author information

Author notes

  1. Xuan Zheng

    Present address: Research Scientist with the Seagate Corporation in Minneapolis, Minneapolis, MN, USA

Authors and Affiliations

  1. Department of Materials Science and Engineering, The Ohio State University in Columbus, Columbus, OH, USA

    Ji-Cheng Zhao

  2. Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana-Champaign, IL, USA

    Xuan Zheng & David G. Cahill

Authors
  1. Ji-Cheng Zhao
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Xuan Zheng
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. David G. Cahill
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Ji-Cheng Zhao.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Zhao, JC., Zheng, X. & Cahill, D.G. High-throughput measurements of materials properties. JOM 63, 40–44 (2011). https://doi.org/10.1007/s11837-011-0044-z

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11837-011-0044-z

Keywords

Search

Navigation