Abstract
It has been shown that the observed correlation between the resistivity ρ of high-resistivity metallic alloys and the sign of the temperature derivative of their resistivity can be explained by taking into account the weak localization effect. This correlation is as follows: the derivative dρ/dT is negative for alloys with resistivity in the range of 150–300 μΩ cm, which corresponds to the mean free path of electrons about the interatomic distance; however, this derivative is positive for alloys with lower resistivities (Mooij rule).
Similar content being viewed by others
References
J. H. Mooij, Phys. Status Solidi A 17, 521 (1973).
Z. Fisk and G. W. Webb, Phys. Rev. Lett. 36, 1084 (1976).
A. A. Abrikosov, Fundamentals of the Theory of Metals (Nauka, Moscow, 1987; North-Holland, Amsterdam, 1988).
V. F. Gantmakher and I. B. Levinson, Carrier Scattering in Metals and Semiconductors (Nauka, Moscow, 1984; North-Holland, Amsterdam, 1987).
V. F. Gantmakher, Electrons and Disorder in Solids (Fizmatlit, Moscow, 2005; Oxford Univ. Press, 2005).
Y. Imry, Phys. Rev. Lett. 44, 469 (1980).
E. Abrahams, P. W. Anderson, D. C. Licciardello, and T. W. Ramakrishnan, Phys. Rev. Lett. 42, 673 (1979).
Y. Imry, Introduction to Mesoscopic Physics (Oxford Univ. Press, Oxford, 2002).
L. P. Gor’kov, A. I. Larkin, and D. E. Khmel’nitskii, JETP Lett. 30, 228 (1979).
G. Bergmann, Phys. Rep. 107, 1 (1984).
B. I. Altshuler and A. G. Aronov, in Electron-Electron Interactions in Disordered Systems, Ed. by A. L. Efros and M. Pollak (North-Holland, Amsterdam, 1985).
J. J. Lin and C. Y. Wu, Phys. Rev. B 48, 5021 (1993).
L. Li, S. T. Lin, C. Dong, and J. J. Lin, Phys. Rev. B 74, 172201 (2006).
Author information
Authors and Affiliations
Additional information
Original Russian Text © V.F. Gantmakher, 2011, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2011, Vol. 94, No. 8, pp. 668–671.
Rights and permissions
About this article
Cite this article
Gantmakher, V.F. Mooij rule and weak localization. Jetp Lett. 94, 626–628 (2011). https://doi.org/10.1134/S0021364011200033
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0021364011200033