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Electrodynamic Analysis of Near-Field Enhancement

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NanoBiotechnology

Abstract

The paper reviews computational models for plasmonic field enhancement, especially with applications to tip-enhanced scanning near-field optical microscopy (SNOM). Both plasmon-enhanced and scattering-type SNOM are considered. The importance of full electrodynamic analysis is emphasized: the electrostatic treatment is valid only if the size of the whole system, rather than its individual components (such as the apex of the tip or an individual particle in a cluster), is much smaller than the wavelength. Illustrative numerical results are included.

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Notes

  1. http://www.nanonics.co.il/indexphp?page_id=149.

  2. Unless the external field happens to be orthogonal (in the sense of functional analysis) to the respective resonance eigenmode.

  3. See also http://www.ddm.org.

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Acknowledgements

We are grateful to Alexei Sokolov and Fritz Keilmann for giving us the opportunity to collaborate with them on the SNOM analysis. We thank Mark Stockman, Gennady Shvets, and Isaak Mayergoyz for interesting discussions and Hans Hallen for his invitation to submit this paper. The anonymous reviewer’s kind and helpful comments are also greatly appreciated.

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  1. Department of Electrical and Computer Engineering, The University of Akron, Akron, OH, 44325-3904, USA

    Igor Tsukerman, František Čajko & Jianhua Dai

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  1. Igor Tsukerman
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  3. Jianhua Dai
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Correspondence to Igor Tsukerman.

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Tsukerman, I., Čajko, F. & Dai, J. Electrodynamic Analysis of Near-Field Enhancement. Nanobiotechnol 3, 148–163 (2007). https://doi.org/10.1007/s12030-008-9016-y

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