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Product Integrity and Reliability in Design

  • Book
  • © 2001

Overview

Editors:
  1. John W. Evans

    1. School of Materials Science and Engineering, Mailstop 32-202, College of Engineering, Seoul National University, Seoul, Korea

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    You can also search for this editor in PubMed   Google Scholar

  2. Jillian Y. Evans

    1. Quentech, Kyonggi-do, Korea

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    You can also search for this editor in PubMed   Google Scholar

  • First book to take a process-oriented view of failure and reliability
  • Case studies provide practical demonstration of integrated reliability analysis
  • Suitable for both graduate students and practitioners

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Table of contents (14 chapters)

  1. Front Matter

    Pages i-xiv
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  2. Concepts

    1. Front Matter

      Pages 1-1
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    2. Introduction to Product Integrity and Reliability Assessment

      • John W. Evans, Jillian Y. Evans, Dong-su Ryu
      Pages 3-19

    3. Elements of Probability for Reliability Assessment

      • Hyung S. Hahn
      Pages 20-53

    4. Concepts in Reliability for Design

      • Jillian Y. Evans, John W. Evans
      Pages 54-86

  3. Failure Mechanics

    1. Front Matter

      Pages 87-87
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    2. Overstress Failure and Load — Strength Interference

      • John W. Evans
      Pages 89-112

    3. Elements of Fatigue and Related Mechanisms

      • John W. Evans
      Pages 113-145

    4. Applications of Finite Element Analysis and Whole Field Stress Measurement

      • Mark S. Fan
      Pages 146-177

    5. Elements of Corrosion

      • John W. Evans, Sun-wook Kim
      Pages 178-203

    6. Failures in Electronic Assemblies and Devices

      • Michael Pecht, Patrick McCluskey, Jillian Y. Evans
      Pages 204-232

    7. Case Studies in Product Failure and Failure Analysis

      • John W. Evans, Jillian Y. Evans
      Pages 233-250

  4. Testing and Failure Analysis

    1. Front Matter

      Pages 251-251
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    2. Introduction to Testing and Test Effectiveness for Reliability Assessment

      • Steven L. Cornford
      Pages 253-287

    3. Design and Analysis of Statistical Experiments

      • John W. Evans, Jillian Y. Evans
      Pages 288-311

    4. Accelerated Testing and Data Analysis

      • John W. Evans, Kyoung-Taeg Lee
      Pages 312-337

    5. Failure Analysis of Assemblies and Devices

      • Michael Pecht, Patrick McCluskey
      Pages 338-369

    6. Case Studies in Product Development and Improvement

      • John W. Evans, Jillian Y. Evans, H. S. Jeon
      Pages 370-386

  5. Back Matter

    Pages 387-402
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Keywords

About this book

Product Integrity and Reliability in Design is intended to serve either as a text for graduate students or as a reference for practicing engineers. The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field. It approaches the subject from the point of view of a process and integrates the necessary methods to support that process. The book can be used to teach first- or second-year postgraduate students in mechanical, electrical, manufacturing and materials engineering about addressing issues of reliability during product development. It will also serve practicing engineers involved in the design and development of electrical and mechanical components and systems, as a reference.
The book takes an interdisciplinary approach appropriate to system engineering, stressing concepts that can be integrated into design and placing less emphasis on traditional assumptions about reliability and analysis as a separate development activity. Several case studies emphasize the understanding of failure mechanisms and failure prevention and show how reliability methods, including simulation and testing can be integrated into design and development.

Editors and Affiliations

  • School of Materials Science and Engineering, Mailstop 32-202, College of Engineering, Seoul National University, Seoul, Korea

    John W. Evans

  • Quentech, Kyonggi-do, Korea

    Jillian Y. Evans

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